Результаты исследований: Вклад в журнал › Статья › Рецензирование
Soft X-ray (XUV) excitation did make it possible to avoid the predominant role of the surface effects in luminescence of NiO and revealed a bulk luminescence with a puzzling well isolated doublet of very narrow lines with close energies near 3. 3 eV which is assigned to recombination transitions in self-trapped d-d charge transfer (CT) excitons formed by coupled Jahn-Teller Ni + and Ni 3+ centers. The conclusion is supported both by a comparative analysis of the CT luminescence spectra for NiO and solid solutions Ni xZn 1 - xO, and by a comprehensive cluster model assignment of different p-d and d-d CT transitions, their relaxation channels. To the best of our knowledge, it is the first observation of the luminescence due to self-trapped d-d CT excitons.
Язык оригинала | Английский |
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Страницы (с-по) | 595-600 |
Число страниц | 6 |
Журнал | Письма в Журнал экспериментальной и теоретической физики |
Том | 95 |
Номер выпуска | 10 |
Состояние | Опубликовано - июл. 2012 |
ID: 9335718