Standard

Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence. / Sokolov, V. I.; Pustovarov, V. A.; Churmanov, V. N. и др.
в: Письма в Журнал экспериментальной и теоретической физики, Том 95, № 10, 07.2012, стр. 595-600.

Результаты исследований: Вклад в журнал › Статья › Рецензирование

Harvard

Sokolov, VI, Pustovarov, VA, Churmanov, VN, Ivanov, VY, Gruzdev, NB, Sokolov, PS, Baranov, AN & Moskvin, AS 2012, 'Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence', Письма в Журнал экспериментальной и теоретической физики, Том. 95, № 10, стр. 595-600.

APA

Sokolov, V. I., Pustovarov, V. A., Churmanov, V. N., Ivanov, V. Y., Gruzdev, N. B., Sokolov, P. S., Baranov, A. N., & Moskvin, A. S. (2012). Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence. Письма в Журнал экспериментальной и теоретической физики, 95(10), 595-600.

Vancouver

Sokolov VI, Pustovarov VA, Churmanov VN, Ivanov VY, Gruzdev NB, Sokolov PS и др. Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence. Письма в Журнал экспериментальной и теоретической физики. 2012 июль;95(10):595-600.

Author

Sokolov, V. I. ; Pustovarov, V. A. ; Churmanov, V. N. и др. / Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence. в: Письма в Журнал экспериментальной и теоретической физики. 2012 ; Том 95, № 10. стр. 595-600.

BibTeX

@article{cb682247b72049a886fe64dd71422e6f,
title = "Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence",
abstract = "Soft X-ray (XUV) excitation did make it possible to avoid the predominant role of the surface effects in luminescence of NiO and revealed a bulk luminescence with a puzzling well isolated doublet of very narrow lines with close energies near 3. 3 eV which is assigned to recombination transitions in self-trapped d-d charge transfer (CT) excitons formed by coupled Jahn-Teller Ni + and Ni 3+ centers. The conclusion is supported both by a comparative analysis of the CT luminescence spectra for NiO and solid solutions Ni xZn 1 - xO, and by a comprehensive cluster model assignment of different p-d and d-d CT transitions, their relaxation channels. To the best of our knowledge, it is the first observation of the luminescence due to self-trapped d-d CT excitons.",
keywords = "ELECTRONIC-STRUCTURE, OPTICAL PROPERTIES, ELECTROREFLECTANCE, EXCITATIONS, IMPURITIES, OXIDES",
author = "Sokolov, {V. I.} and Pustovarov, {V. A.} and Churmanov, {V. N.} and Ivanov, {V. Yu} and Gruzdev, {N. B.} and Sokolov, {P. S.} and Baranov, {A. N.} and Moskvin, {A. S.}",
year = "2012",
month = jul,
language = "English",
volume = "95",
pages = "595--600",
journal = "Письма в Журнал экспериментальной и теоретической физики",
issn = "0370-274X",
publisher = "Издательство {"}Наука{"}",
number = "10",

}

RIS

TY - JOUR

T1 - Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence

AU - Sokolov, V. I.

AU - Pustovarov, V. A.

AU - Churmanov, V. N.

AU - Ivanov, V. Yu

AU - Gruzdev, N. B.

AU - Sokolov, P. S.

AU - Baranov, A. N.

AU - Moskvin, A. S.

PY - 2012/7

Y1 - 2012/7

N2 - Soft X-ray (XUV) excitation did make it possible to avoid the predominant role of the surface effects in luminescence of NiO and revealed a bulk luminescence with a puzzling well isolated doublet of very narrow lines with close energies near 3. 3 eV which is assigned to recombination transitions in self-trapped d-d charge transfer (CT) excitons formed by coupled Jahn-Teller Ni + and Ni 3+ centers. The conclusion is supported both by a comparative analysis of the CT luminescence spectra for NiO and solid solutions Ni xZn 1 - xO, and by a comprehensive cluster model assignment of different p-d and d-d CT transitions, their relaxation channels. To the best of our knowledge, it is the first observation of the luminescence due to self-trapped d-d CT excitons.

AB - Soft X-ray (XUV) excitation did make it possible to avoid the predominant role of the surface effects in luminescence of NiO and revealed a bulk luminescence with a puzzling well isolated doublet of very narrow lines with close energies near 3. 3 eV which is assigned to recombination transitions in self-trapped d-d charge transfer (CT) excitons formed by coupled Jahn-Teller Ni + and Ni 3+ centers. The conclusion is supported both by a comparative analysis of the CT luminescence spectra for NiO and solid solutions Ni xZn 1 - xO, and by a comprehensive cluster model assignment of different p-d and d-d CT transitions, their relaxation channels. To the best of our knowledge, it is the first observation of the luminescence due to self-trapped d-d CT excitons.

KW - ELECTRONIC-STRUCTURE

KW - OPTICAL PROPERTIES

KW - ELECTROREFLECTANCE

KW - EXCITATIONS

KW - IMPURITIES

KW - OXIDES

UR - https://elibrary.ru/item.asp?id=17797385

M3 - Article

VL - 95

SP - 595

EP - 600

JO - Письма в Журнал экспериментальной и теоретической физики

JF - Письма в Журнал экспериментальной и теоретической физики

SN - 0370-274X

IS - 10

ER -

ID: 9335718