Soft X-ray (XUV) excitation did make it possible to avoid the predominant role of the surface effects in luminescence of NiO and revealed a bulk luminescence with a puzzling well isolated doublet of very narrow lines with close energies near 3. 3 eV which is assigned to recombination transitions in self-trapped d-d charge transfer (CT) excitons formed by coupled Jahn-Teller Ni + and Ni 3+ centers. The conclusion is supported both by a comparative analysis of the CT luminescence spectra for NiO and solid solutions Ni xZn 1 - xO, and by a comprehensive cluster model assignment of different p-d and d-d CT transitions, their relaxation channels. To the best of our knowledge, it is the first observation of the luminescence due to self-trapped d-d CT excitons.

Original languageEnglish
Pages (from-to)595-600
Number of pages6
JournalПисьма в Журнал экспериментальной и теоретической физики
Volume95
Issue number10
Publication statusPublished - Jul 2012

    Level of Research Output

  • VAK List

    GRNTI

  • 29.00.00 PHYSICS

    Research areas

  • ELECTRONIC-STRUCTURE, OPTICAL PROPERTIES, ELECTROREFLECTANCE, EXCITATIONS, IMPURITIES, OXIDES

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