Mass-spectroscopic study of the diffusion and solubility of helium in submicrocrystalline palladium

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Mass-spectroscopic study of the diffusion and solubility of helium in submicrocrystalline palladium. / Zhiganov, A.; Kupryazhkin, A.; Mulyukov, R. и др.
в: Technical Physics, Том 47, № 11, 2002, стр. 1440-1443.

Результаты исследований: Вклад в журнал › Статья › Рецензирование

BibTeX

@article{db9033b5351742a0805e55b3e5bd6afd,

title = "Mass-spectroscopic study of the diffusion and solubility of helium in submicrocrystalline palladium",

abstract = "By the method of helium thermal desorption from submicrocrystalline palladium presaturated in the gaseous phase, the diffusion coefficient Dff and solubility coefficient Ceff of helium are measured in the range P = 0-3 MPa and T = 293-508 K. The pressure dependence of Ceff flattens at high pressures. At low saturation pressures, the temperature dependences of the diffusion and solubility coefficients may be divided into (1) high-temperature (400-508 K) and (2) low-temperature (293-400 K) ranges described by the exponentials D1, 2 = D0exp(-E1,2D/kT) and C1, 2 = C0exp(-E1,2S/kT). The energies of diffusion activation are E2D = 0.0036 ± 0.0015 eV and E1D = 0.33 ± 0.03 eV, and the solution energies are E2S = -0.025 ± 0.008 eV and E1S = 0.086 ± 0.008 eV in the low- and high-temperature ranges, respectively. Mechanisms behind the diffusion and solution of helium are discussed. {\textcopyright} 2002 MAIK {"}Nauka/Interperiodica{"}.",

author = "A. Zhiganov and A. Kupryazhkin and R. Mulyukov and Bitkulov, {I. Kh.}",

note = "R.R. Mulyukov and I.Kh. Bitkulov are grateful to the Russian Foundation for Basic Research (grant no. 02-01-97924-r2002agidel a) and the Integrated program “Nanocrystals and Supramolecular Systems” of the Russian Academy of Sciences for partial financial support.",

year = "2002",

doi = "10.1134/1.1522114",

language = "English",

volume = "47",

pages = "1440--1443",

journal = "Technical Physics",

issn = "1063-7842",

publisher = "American Institute of Physics Publising LLC",

number = "11",

}

RIS

TY - JOUR

T1 - Mass-spectroscopic study of the diffusion and solubility of helium in submicrocrystalline palladium

AU - Zhiganov, A.

AU - Kupryazhkin, A.

AU - Mulyukov, R.

AU - Bitkulov, I. Kh.

N1 - R.R. Mulyukov and I.Kh. Bitkulov are grateful to the Russian Foundation for Basic Research (grant no. 02-01-97924-r2002agidel a) and the Integrated program “Nanocrystals and Supramolecular Systems” of the Russian Academy of Sciences for partial financial support.

PY - 2002

Y1 - 2002

N2 - By the method of helium thermal desorption from submicrocrystalline palladium presaturated in the gaseous phase, the diffusion coefficient Dff and solubility coefficient Ceff of helium are measured in the range P = 0-3 MPa and T = 293-508 K. The pressure dependence of Ceff flattens at high pressures. At low saturation pressures, the temperature dependences of the diffusion and solubility coefficients may be divided into (1) high-temperature (400-508 K) and (2) low-temperature (293-400 K) ranges described by the exponentials D1, 2 = D0exp(-E1,2D/kT) and C1, 2 = C0exp(-E1,2S/kT). The energies of diffusion activation are E2D = 0.0036 ± 0.0015 eV and E1D = 0.33 ± 0.03 eV, and the solution energies are E2S = -0.025 ± 0.008 eV and E1S = 0.086 ± 0.008 eV in the low- and high-temperature ranges, respectively. Mechanisms behind the diffusion and solution of helium are discussed. © 2002 MAIK "Nauka/Interperiodica".

AB - By the method of helium thermal desorption from submicrocrystalline palladium presaturated in the gaseous phase, the diffusion coefficient Dff and solubility coefficient Ceff of helium are measured in the range P = 0-3 MPa and T = 293-508 K. The pressure dependence of Ceff flattens at high pressures. At low saturation pressures, the temperature dependences of the diffusion and solubility coefficients may be divided into (1) high-temperature (400-508 K) and (2) low-temperature (293-400 K) ranges described by the exponentials D1, 2 = D0exp(-E1,2D/kT) and C1, 2 = C0exp(-E1,2S/kT). The energies of diffusion activation are E2D = 0.0036 ± 0.0015 eV and E1D = 0.33 ± 0.03 eV, and the solution energies are E2S = -0.025 ± 0.008 eV and E1S = 0.086 ± 0.008 eV in the low- and high-temperature ranges, respectively. Mechanisms behind the diffusion and solution of helium are discussed. © 2002 MAIK "Nauka/Interperiodica".

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000179042600015

UR - http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=0036861902

U2 - 10.1134/1.1522114

DO - 10.1134/1.1522114

M3 - Article

VL - 47

SP - 1440

EP - 1443

JO - Technical Physics

JF - Technical Physics

SN - 1063-7842

IS - 11

ER -

ID: 43957264