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Interfacial reactions in Al2O3/Cr2O3 layers: Electronic structure calculations and X-ray photoelectron spectra. / Korotin, M. A.; Zhidkov, I. S.; Kukharenko, A. I. и др.
в: Thin Solid Films, Том 665, 01.11.2018, стр. 6-8.

Результаты исследований: Вклад в журнал › Статья › Рецензирование

Harvard

Korotin, MA, Zhidkov, IS, Kukharenko, AI, Cholakh, SO, Kamenetskikh, AS, Gavrilov, NV & Kurmaev, EZ 2018, 'Interfacial reactions in Al2O3/Cr2O3 layers: Electronic structure calculations and X-ray photoelectron spectra', Thin Solid Films, Том. 665, стр. 6-8. https://doi.org/10.1016/j.tsf.2018.08.037

APA

Korotin, M. A., Zhidkov, I. S., Kukharenko, A. I., Cholakh, S. O., Kamenetskikh, A. S., Gavrilov, N. V., & Kurmaev, E. Z. (2018). Interfacial reactions in Al2O3/Cr2O3 layers: Electronic structure calculations and X-ray photoelectron spectra. Thin Solid Films, 665, 6-8. https://doi.org/10.1016/j.tsf.2018.08.037

Vancouver

Korotin MA, Zhidkov IS, Kukharenko AI, Cholakh SO, Kamenetskikh AS, Gavrilov NV и др. Interfacial reactions in Al2O3/Cr2O3 layers: Electronic structure calculations and X-ray photoelectron spectra. Thin Solid Films. 2018 нояб. 1;665:6-8. doi: 10.1016/j.tsf.2018.08.037

Author

Korotin, M. A. ; Zhidkov, I. S. ; Kukharenko, A. I. и др. / Interfacial reactions in Al2O3/Cr2O3 layers: Electronic structure calculations and X-ray photoelectron spectra. в: Thin Solid Films. 2018 ; Том 665. стр. 6-8.

BibTeX

@article{6202ea0b7e1f4b89b0581576d0def495,
title = "Interfacial reactions in Al2O3/Cr2O3 layers: Electronic structure calculations and X-ray photoelectron spectra",
keywords = "Alumina, Chromium oxide, Coherent potential approximation, Density functional theory calculations, Interfacial reactions, X-ray photoelectron spectroscopy, ELEMENTS, CERAMICS",
author = "Korotin, {M. A.} and Zhidkov, {I. S.} and Kukharenko, {A. I.} and Cholakh, {S. O.} and Kamenetskikh, {A. S.} and Gavrilov, {N. V.} and Kurmaev, {E. Z.}",
year = "2018",
month = nov,
day = "1",
doi = "10.1016/j.tsf.2018.08.037",
language = "English",
volume = "665",
pages = "6--8",
journal = "Thin Solid Films",
issn = "0040-6090",
publisher = "Elsevier BV",

}

RIS

TY - JOUR

T1 - Interfacial reactions in Al2O3/Cr2O3 layers: Electronic structure calculations and X-ray photoelectron spectra

AU - Korotin, M. A.

AU - Zhidkov, I. S.

AU - Kukharenko, A. I.

AU - Cholakh, S. O.

AU - Kamenetskikh, A. S.

AU - Gavrilov, N. V.

AU - Kurmaev, E. Z.

PY - 2018/11/1

Y1 - 2018/11/1

KW - Alumina

KW - Chromium oxide

KW - Coherent potential approximation

KW - Density functional theory calculations

KW - Interfacial reactions

KW - X-ray photoelectron spectroscopy

KW - ELEMENTS

KW - CERAMICS

UR - http://www.scopus.com/inward/record.url?scp=85053064929&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000447427400002

UR - https://elibrary.ru/item.asp?id=35720730

U2 - 10.1016/j.tsf.2018.08.037

DO - 10.1016/j.tsf.2018.08.037

M3 - Article

AN - SCOPUS:85053064929

VL - 665

SP - 6

EP - 8

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

ER -

ID: 7889984