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Experimental Light Scattering by Small Particles: System Design and Calibration. / Maconi, Goran; Kassamakov, Ivan; Penttila, Antti и др.
Optical Measurement Systems for Industrial Inspection X. ред. / P Lehmann; W Osten; AA Goncalves. Том 10329 SPIE International Optical Engineering, 2017. 103292S (Proceedings of SPIE; Том 10329).
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Harvard
Maconi, G, Kassamakov, I, Penttila, A
, Gritsevich, M, Haeggstrom, E & Muinonen, K 2017,
Experimental Light Scattering by Small Particles: System Design and Calibration. в P Lehmann, W Osten & AA Goncalves (ред.),
Optical Measurement Systems for Industrial Inspection X. Том. 10329, 103292S, Proceedings of SPIE, Том. 10329, SPIE International Optical Engineering, Conference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium, Munich, Германия,
26/06/2017.
https://doi.org/10.1117/12.2269518APA
Maconi, G., Kassamakov, I., Penttila, A.
, Gritsevich, M., Haeggstrom, E., & Muinonen, K. (2017).
Experimental Light Scattering by Small Particles: System Design and Calibration. в P. Lehmann, W. Osten, & AA. Goncalves (Ред.),
Optical Measurement Systems for Industrial Inspection X (Том 10329). [103292S] (Proceedings of SPIE; Том 10329). SPIE International Optical Engineering.
https://doi.org/10.1117/12.2269518Vancouver
Author
BibTeX
@inproceedings{f9928f190b974ef49397d915d3a97795,
title = "Experimental Light Scattering by Small Particles: System Design and Calibration",
keywords = "light scattering, polarized reflectance, calibration, optical properties",
author = "Goran Maconi and Ivan Kassamakov and Antti Penttila and Maria Gritsevich and Edward Haeggstrom and Karri Muinonen",
year = "2017",
doi = "10.1117/12.2269518",
language = "English",
isbn = "978-1-5106-1103-0",
volume = "10329",
series = "Proceedings of SPIE",
publisher = "SPIE International Optical Engineering",
editor = "P Lehmann and W Osten and AA Goncalves",
booktitle = "Optical Measurement Systems for Industrial Inspection X",
address = "United States",
note = "Conference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium ; Conference date: 26-06-2017 Through 29-06-2017",
}
RIS
TY - GEN
T1 - Experimental Light Scattering by Small Particles: System Design and Calibration
AU - Maconi, Goran
AU - Kassamakov, Ivan
AU - Penttila, Antti
AU - Gritsevich, Maria
AU - Haeggstrom, Edward
AU - Muinonen, Karri
PY - 2017
Y1 - 2017
KW - light scattering
KW - polarized reflectance
KW - calibration
KW - optical properties
UR - http://www.scopus.com/inward/record.url?scp=85029149588&partnerID=8YFLogxK
UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000407289600081
U2 - 10.1117/12.2269518
DO - 10.1117/12.2269518
M3 - Conference contribution
SN - 978-1-5106-1103-0
VL - 10329
T3 - Proceedings of SPIE
BT - Optical Measurement Systems for Industrial Inspection X
A2 - Lehmann, P
A2 - Osten, W
A2 - Goncalves, AA
PB - SPIE International Optical Engineering
T2 - Conference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium
Y2 - 26 June 2017 through 29 June 2017
ER -
