Standard

Application of semiconductor laser emitters to thickness measurements. / Shlychkov, V. I.
Proceedings - International Conference Laser Optics 2020, ICLO 2020. Institute of Electrical and Electronics Engineers Inc., 2020. 9285874 (Proceedings - International Conference Laser Optics 2020, ICLO 2020).

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Harvard

Shlychkov, VI 2020, Application of semiconductor laser emitters to thickness measurements. в Proceedings - International Conference Laser Optics 2020, ICLO 2020., 9285874, Proceedings - International Conference Laser Optics 2020, ICLO 2020, Institute of Electrical and Electronics Engineers Inc., 2020 International Conference Laser Optics, ICLO 2020, St. Petersburg, Российская Федерация, 02/11/2020. https://doi.org/10.1109/ICLO48556.2020.9285874

APA

Shlychkov, V. I. (2020). Application of semiconductor laser emitters to thickness measurements. в Proceedings - International Conference Laser Optics 2020, ICLO 2020 [9285874] (Proceedings - International Conference Laser Optics 2020, ICLO 2020). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICLO48556.2020.9285874

Vancouver

Shlychkov VI. Application of semiconductor laser emitters to thickness measurements. в Proceedings - International Conference Laser Optics 2020, ICLO 2020. Institute of Electrical and Electronics Engineers Inc. 2020. 9285874. (Proceedings - International Conference Laser Optics 2020, ICLO 2020). doi: 10.1109/ICLO48556.2020.9285874

Author

Shlychkov, V. I. / Application of semiconductor laser emitters to thickness measurements. Proceedings - International Conference Laser Optics 2020, ICLO 2020. Institute of Electrical and Electronics Engineers Inc., 2020. (Proceedings - International Conference Laser Optics 2020, ICLO 2020).

BibTeX

@inproceedings{070f0aa80dbe43ac932527e4aaca53f5,
title = "Application of semiconductor laser emitters to thickness measurements",
keywords = "laser beam, laser diode, laser thickness gauge, light spot dimension, surface roughness, laser bean",
author = "Shlychkov, {V. I.}",
year = "2020",
month = nov,
day = "2",
doi = "10.1109/ICLO48556.2020.9285874",
language = "English",
series = "Proceedings - International Conference Laser Optics 2020, ICLO 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - International Conference Laser Optics 2020, ICLO 2020",
address = "United States",
note = "2020 International Conference Laser Optics, ICLO 2020 ; Conference date: 02-11-2020 Through 06-11-2020",

}

RIS

TY - GEN

T1 - Application of semiconductor laser emitters to thickness measurements

AU - Shlychkov, V. I.

PY - 2020/11/2

Y1 - 2020/11/2

KW - laser beam

KW - laser diode

KW - laser thickness gauge

KW - light spot dimension

KW - surface roughness

KW - laser bean

UR - http://www.scopus.com/inward/record.url?scp=85099351232&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000685170600463

U2 - 10.1109/ICLO48556.2020.9285874

DO - 10.1109/ICLO48556.2020.9285874

M3 - Conference contribution

AN - SCOPUS:85099351232

T3 - Proceedings - International Conference Laser Optics 2020, ICLO 2020

BT - Proceedings - International Conference Laser Optics 2020, ICLO 2020

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2020 International Conference Laser Optics, ICLO 2020

Y2 - 2 November 2020 through 6 November 2020

ER -

ID: 20517459