Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
}
TY - GEN
T1 - Application of semiconductor laser emitters to thickness measurements
AU - Shlychkov, V. I.
PY - 2020/11/2
Y1 - 2020/11/2
KW - laser beam
KW - laser diode
KW - laser thickness gauge
KW - light spot dimension
KW - surface roughness
KW - laser bean
UR - http://www.scopus.com/inward/record.url?scp=85099351232&partnerID=8YFLogxK
UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000685170600463
U2 - 10.1109/ICLO48556.2020.9285874
DO - 10.1109/ICLO48556.2020.9285874
M3 - Conference contribution
AN - SCOPUS:85099351232
T3 - Proceedings - International Conference Laser Optics 2020, ICLO 2020
BT - Proceedings - International Conference Laser Optics 2020, ICLO 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 International Conference Laser Optics, ICLO 2020
Y2 - 2 November 2020 through 6 November 2020
ER -
ID: 20517459