An updated system of program-controlled analog and analog-to-digital modules for X-ray spectrometers with semiconductor detectors is reported. Ways to increase the count rate capacity of pulse-drain feedback charge-sensitive preamplifiers to 106 cps for Ex = 5.9 keV are considered in detail. A new analog processor model AP-007 incorporating Kandiah's cusp-shaper is described. Some problems of further improvements in the modular system are discussed.