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X-ray fluorescence analysis of K, Al and trace elements in chloroaluminate melts. / Shibitko, A. O.; Abramov, A. V.; Denisov, E. I. и др.
Physics, Technologies and Innovation, PTI 2017: Proceedings of the IV International Young Researchers' Conference. Том 1886 American Institute of Physics Inc., 2017. 020038.

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Harvard

Shibitko, AO, Abramov, AV, Denisov, EI, Lisienko, DG, Rebrin, OI, Bunkov, GM & Rychkov, VN 2017, X-ray fluorescence analysis of K, Al and trace elements in chloroaluminate melts. в Physics, Technologies and Innovation, PTI 2017: Proceedings of the IV International Young Researchers' Conference. Том. 1886, 020038, American Institute of Physics Inc., 4th International Young Researchers' Conference: Physics, Technologies and Innovation, PTI 2017, Ekaterinburg, Российская Федерация, 15/05/2017. https://doi.org/10.1063/1.5002935

APA

Shibitko, A. O., Abramov, A. V., Denisov, E. I., Lisienko, D. G., Rebrin, O. I., Bunkov, G. M., & Rychkov, V. N. (2017). X-ray fluorescence analysis of K, Al and trace elements in chloroaluminate melts. в Physics, Technologies and Innovation, PTI 2017: Proceedings of the IV International Young Researchers' Conference (Том 1886). [020038] American Institute of Physics Inc.. https://doi.org/10.1063/1.5002935

Vancouver

Shibitko AO, Abramov AV, Denisov EI, Lisienko DG, Rebrin OI, Bunkov GM и др. X-ray fluorescence analysis of K, Al and trace elements in chloroaluminate melts. в Physics, Technologies and Innovation, PTI 2017: Proceedings of the IV International Young Researchers' Conference. Том 1886. American Institute of Physics Inc. 2017. 020038 doi: 10.1063/1.5002935

Author

Shibitko, A. O. ; Abramov, A. V. ; Denisov, E. I. и др. / X-ray fluorescence analysis of K, Al and trace elements in chloroaluminate melts. Physics, Technologies and Innovation, PTI 2017: Proceedings of the IV International Young Researchers' Conference. Том 1886 American Institute of Physics Inc., 2017.

BibTeX

@inproceedings{d5dd889ca7f641e2b666270e2ffda2f9,
title = "X-ray fluorescence analysis of K, Al and trace elements in chloroaluminate melts",
author = "Shibitko, {A. O.} and Abramov, {A. V.} and Denisov, {E. I.} and Lisienko, {D. G.} and Rebrin, {O. I.} and Bunkov, {G. M.} and Rychkov, {V. N.}",
year = "2017",
month = sep,
day = "26",
doi = "10.1063/1.5002935",
language = "English",
volume = "1886",
booktitle = "Physics, Technologies and Innovation, PTI 2017",
publisher = "American Institute of Physics Inc.",
address = "United States",
note = "4th International Young Researchers' Conference: Physics, Technologies and Innovation, PTI 2017 ; Conference date: 15-05-2017 Through 19-05-2017",

}

RIS

TY - GEN

T1 - X-ray fluorescence analysis of K, Al and trace elements in chloroaluminate melts

AU - Shibitko, A. O.

AU - Abramov, A. V.

AU - Denisov, E. I.

AU - Lisienko, D. G.

AU - Rebrin, O. I.

AU - Bunkov, G. M.

AU - Rychkov, V. N.

PY - 2017/9/26

Y1 - 2017/9/26

UR - http://www.scopus.com/inward/record.url?scp=85031126212&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000418447300038

U2 - 10.1063/1.5002935

DO - 10.1063/1.5002935

M3 - Conference contribution

AN - SCOPUS:85031126212

VL - 1886

BT - Physics, Technologies and Innovation, PTI 2017

PB - American Institute of Physics Inc.

T2 - 4th International Young Researchers' Conference: Physics, Technologies and Innovation, PTI 2017

Y2 - 15 May 2017 through 19 May 2017

ER -

ID: 2212763