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Studying the microstructure of Ti-Al-Si-N coating using Kβ x-ray. / Kukushkin, D. E.
; Chernyshov, L. M.; Bryukhanova, Yu A. и др.
Physics, Technologies and Innovation, PTI 2019: Proceedings of the VI International Young Researchers Conference. ред. / Vladimir A. Volkovich; Sergey V. Zvonarev; Ilya V. Kashin; Andrey A. Smirnov; Evgeniy D. Narkhov. American Institute of Physics Inc., 2019. 020126 (AIP Conference Proceedings; Том 2174).
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Harvard
Kukushkin, DE
, Chernyshov, LM, Bryukhanova, YA & Chukin, AV 2019,
Studying the microstructure of Ti-Al-Si-N coating using Kβ x-ray. в VA Volkovich, SV Zvonarev, IV Kashin, AA Smirnov & ED Narkhov (ред.),
Physics, Technologies and Innovation, PTI 2019: Proceedings of the VI International Young Researchers Conference., 020126, AIP Conference Proceedings, Том. 2174, American Institute of Physics Inc., 6th International Young Researchers'' Conference on Physics, Technologies and Innovation, PTI 2019, Ekaterinburg, Российская Федерация,
20/05/2019.
https://doi.org/10.1063/1.5134277APA
Kukushkin, D. E.
, Chernyshov, L. M., Bryukhanova, Y. A., & Chukin, A. V. (2019).
Studying the microstructure of Ti-Al-Si-N coating using Kβ x-ray. в V. A. Volkovich, S. V. Zvonarev, I. V. Kashin, A. A. Smirnov, & E. D. Narkhov (Ред.),
Physics, Technologies and Innovation, PTI 2019: Proceedings of the VI International Young Researchers Conference [020126] (AIP Conference Proceedings; Том 2174). American Institute of Physics Inc..
https://doi.org/10.1063/1.5134277Vancouver
Kukushkin DE
, Chernyshov LM, Bryukhanova YA, Chukin AV.
Studying the microstructure of Ti-Al-Si-N coating using Kβ x-ray. в Volkovich VA, Zvonarev SV, Kashin IV, Smirnov AA, Narkhov ED, Редакторы, Physics, Technologies and Innovation, PTI 2019: Proceedings of the VI International Young Researchers Conference. American Institute of Physics Inc. 2019. 020126. (AIP Conference Proceedings). doi: 10.1063/1.5134277
Author
BibTeX
@inproceedings{3d91aca2a4504b669bbf7fee85acc007,
title = "Studying the microstructure of Ti-Al-Si-N coating using Kβ x-ray",
author = "Kukushkin, {D. E.} and Chernyshov, {L. M.} and Bryukhanova, {Yu A.} and Chukin, {A. V.}",
year = "2019",
month = dec,
day = "6",
doi = "10.1063/1.5134277",
language = "English",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
editor = "Volkovich, {Vladimir A.} and Zvonarev, {Sergey V.} and Kashin, {Ilya V.} and Smirnov, {Andrey A.} and Narkhov, {Evgeniy D.}",
booktitle = "Physics, Technologies and Innovation, PTI 2019",
address = "United States",
note = "6th International Young Researchers'' Conference on Physics, Technologies and Innovation, PTI 2019 ; Conference date: 20-05-2019 Through 23-05-2019",
}
RIS
TY - GEN
T1 - Studying the microstructure of Ti-Al-Si-N coating using Kβ x-ray
AU - Kukushkin, D. E.
AU - Chernyshov, L. M.
AU - Bryukhanova, Yu A.
AU - Chukin, A. V.
PY - 2019/12/6
Y1 - 2019/12/6
UR - http://www.scopus.com/inward/record.url?scp=85076611961&partnerID=8YFLogxK
UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000618895900126
U2 - 10.1063/1.5134277
DO - 10.1063/1.5134277
M3 - Conference contribution
AN - SCOPUS:85076611961
T3 - AIP Conference Proceedings
BT - Physics, Technologies and Innovation, PTI 2019
A2 - Volkovich, Vladimir A.
A2 - Zvonarev, Sergey V.
A2 - Kashin, Ilya V.
A2 - Smirnov, Andrey A.
A2 - Narkhov, Evgeniy D.
PB - American Institute of Physics Inc.
T2 - 6th International Young Researchers'' Conference on Physics, Technologies and Innovation, PTI 2019
Y2 - 20 May 2019 through 23 May 2019
ER -
