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Structural and thermal stability of BIMEVOX oxygen semiconductors. / Morozova, M. V.; Buyanova, E. S.; Petrova, S. A. и др.
в: Russian Journal of Electrochemistry, Том 47, № 4, 01.04.2011, стр. 448-452.

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Morozova MV, Buyanova ES, Petrova SA, Khisametdinova VV, Emel’yanova YV, Shatokhina AN и др. Structural and thermal stability of BIMEVOX oxygen semiconductors. Russian Journal of Electrochemistry. 2011 апр. 1;47(4):448-452. doi: 10.1134/S1023193511040100

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Morozova, M. V. ; Buyanova, E. S. ; Petrova, S. A. и др. / Structural and thermal stability of BIMEVOX oxygen semiconductors. в: Russian Journal of Electrochemistry. 2011 ; Том 47, № 4. стр. 448-452.

BibTeX

@article{93c1ce27b8e64083b5925c34f56d117a,
title = "Structural and thermal stability of BIMEVOX oxygen semiconductors",
abstract = "The results on the structural and thermal stability of different modifications of solid solutions Bi(4)V(2-x)Fe(x)O(11) (-) (delta) (BIFEVOX), where x = 0.05-0.6, and Bi(4)V(2-x)Cu(x/2)Ti(x/2)O(11) - (delta) (BICUTIVOX), where x = 0.025-0.50, are shown. The stability is assessed by varying the thermodynamic parameters of the medium and also the time parameters with the use of modern methods, namely, the high-temperature X-ray diffraction analysis, the differential scanning calorimetry, and the dilatometry. The. gamma-modification of BIFEVOX is shown to be stable in a wide range of temperatures and oxygen partial pressures.",
author = "Morozova, {M. V.} and Buyanova, {E. S.} and Petrova, {S. A.} and Khisametdinova, {V. V.} and Emel{\textquoteright}yanova, {Yu. V.} and Shatokhina, {A. N.} and Zhukovskii, {V. M.}",
note = "This study was financially supported by the Minis try of Education and Science of the Russian Federa tion within the framework of the Federal Target Pro gram “Research and Scientific Pedagogical Special ists of Innovational Russia in 2009–2013”.",
year = "2011",
month = apr,
day = "1",
doi = "10.1134/S1023193511040100",
language = "English",
volume = "47",
pages = "448--452",
journal = "Russian Journal of Electrochemistry",
issn = "1023-1935",
publisher = "Pleiades Publishing",
number = "4",

}

RIS

TY - JOUR

T1 - Structural and thermal stability of BIMEVOX oxygen semiconductors

AU - Morozova, M. V.

AU - Buyanova, E. S.

AU - Petrova, S. A.

AU - Khisametdinova, V. V.

AU - Emel’yanova, Yu. V.

AU - Shatokhina, A. N.

AU - Zhukovskii, V. M.

N1 - This study was financially supported by the Minis try of Education and Science of the Russian Federa tion within the framework of the Federal Target Pro gram “Research and Scientific Pedagogical Special ists of Innovational Russia in 2009–2013”.

PY - 2011/4/1

Y1 - 2011/4/1

N2 - The results on the structural and thermal stability of different modifications of solid solutions Bi(4)V(2-x)Fe(x)O(11) (-) (delta) (BIFEVOX), where x = 0.05-0.6, and Bi(4)V(2-x)Cu(x/2)Ti(x/2)O(11) - (delta) (BICUTIVOX), where x = 0.025-0.50, are shown. The stability is assessed by varying the thermodynamic parameters of the medium and also the time parameters with the use of modern methods, namely, the high-temperature X-ray diffraction analysis, the differential scanning calorimetry, and the dilatometry. The. gamma-modification of BIFEVOX is shown to be stable in a wide range of temperatures and oxygen partial pressures.

AB - The results on the structural and thermal stability of different modifications of solid solutions Bi(4)V(2-x)Fe(x)O(11) (-) (delta) (BIFEVOX), where x = 0.05-0.6, and Bi(4)V(2-x)Cu(x/2)Ti(x/2)O(11) - (delta) (BICUTIVOX), where x = 0.025-0.50, are shown. The stability is assessed by varying the thermodynamic parameters of the medium and also the time parameters with the use of modern methods, namely, the high-temperature X-ray diffraction analysis, the differential scanning calorimetry, and the dilatometry. The. gamma-modification of BIFEVOX is shown to be stable in a wide range of temperatures and oxygen partial pressures.

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000292270800011

UR - http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=79958134902

U2 - 10.1134/S1023193511040100

DO - 10.1134/S1023193511040100

M3 - Article

VL - 47

SP - 448

EP - 452

JO - Russian Journal of Electrochemistry

JF - Russian Journal of Electrochemistry

SN - 1023-1935

IS - 4

ER -

ID: 37836287