Standard

Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence. / Sokolov, V. I.; Pustovarov, V. A.; Churmanov, V. N. и др.
в: JETP Letters, Том 95, № 10, 07.2012, стр. 528-533.

Результаты исследований: Вклад в журнал › Статья › Рецензирование

Harvard

Sokolov, VI, Pustovarov, VA, Churmanov, VN, Ivanov, VY, Gruzdev, NB, Sokolov, PS, Baranov, AN & Moskvin, AS 2012, 'Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence', JETP Letters, Том. 95, № 10, стр. 528-533. https://doi.org/10.1134/S0021364012100116

APA

Sokolov, V. I., Pustovarov, V. A., Churmanov, V. N., Ivanov, V. Y., Gruzdev, N. B., Sokolov, P. S., Baranov, A. N., & Moskvin, A. S. (2012). Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence. JETP Letters, 95(10), 528-533. https://doi.org/10.1134/S0021364012100116

Vancouver

Sokolov VI, Pustovarov VA, Churmanov VN, Ivanov VY, Gruzdev NB, Sokolov PS и др. Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence. JETP Letters. 2012 июль;95(10):528-533. doi: 10.1134/S0021364012100116

Author

Sokolov, V. I. ; Pustovarov, V. A. ; Churmanov, V. N. и др. / Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence. в: JETP Letters. 2012 ; Том 95, № 10. стр. 528-533.

BibTeX

@article{1b061624f4ff45ed9558984b18a626de,
title = "Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence",
keywords = "ELECTRONIC-STRUCTURE, OPTICAL PROPERTIES, ELECTROREFLECTANCE, EXCITATIONS, IMPURITIES, OXIDES",
author = "Sokolov, {V. I.} and Pustovarov, {V. A.} and Churmanov, {V. N.} and Ivanov, {V. Yu} and Gruzdev, {N. B.} and Sokolov, {P. S.} and Baranov, {A. N.} and Moskvin, {A. S.}",
year = "2012",
month = jul,
doi = "10.1134/S0021364012100116",
language = "English",
volume = "95",
pages = "528--533",
journal = "JETP Letters",
issn = "0021-3640",
publisher = "Pleiades Publishing",
number = "10",

}

RIS

TY - JOUR

T1 - Self-trapping of the d-d charge transfer exciton in bulk NiO evidenced by X-ray excited luminescence

AU - Sokolov, V. I.

AU - Pustovarov, V. A.

AU - Churmanov, V. N.

AU - Ivanov, V. Yu

AU - Gruzdev, N. B.

AU - Sokolov, P. S.

AU - Baranov, A. N.

AU - Moskvin, A. S.

PY - 2012/7

Y1 - 2012/7

KW - ELECTRONIC-STRUCTURE

KW - OPTICAL PROPERTIES

KW - ELECTROREFLECTANCE

KW - EXCITATIONS

KW - IMPURITIES

KW - OXIDES

UR - http://www.scopus.com/inward/record.url?scp=84864390747&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000306950800007

UR - https://elibrary.ru/item.asp?id=20475097

U2 - 10.1134/S0021364012100116

DO - 10.1134/S0021364012100116

M3 - Article

AN - SCOPUS:84864390747

VL - 95

SP - 528

EP - 533

JO - JETP Letters

JF - JETP Letters

SN - 0021-3640

IS - 10

ER -

ID: 1079637