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Research on low-pass filter use as a miniaturization tool. /
Letavin, D. A. Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016. Том 1 Institute of Electrical and Electronics Engineers Inc., 2016. 7878898.
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Letavin, DA 2016,
Research on low-pass filter use as a miniaturization tool. в
Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016. Том. 1, 7878898, Institute of Electrical and Electronics Engineers Inc., 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016, Saratov, Российская Федерация,
22/09/2016.
https://doi.org/10.1109/APEDE.2016.7878898
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BibTeX
@inproceedings{0c99258f7c3043d190361a9c9250ce6e,
title = "Research on low-pass filter use as a miniaturization tool",
author = "Letavin, {D. A.}",
year = "2016",
doi = "10.1109/APEDE.2016.7878898",
language = "English",
volume = "1",
booktitle = "Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016 ; Conference date: 22-09-2016 Through 23-09-2016",
}
RIS
TY - GEN
T1 - Research on low-pass filter use as a miniaturization tool
AU - Letavin, D. A.
PY - 2016
Y1 - 2016
UR - http://www.scopus.com/inward/record.url?scp=85017393629&partnerID=8YFLogxK
UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000405379200059
U2 - 10.1109/APEDE.2016.7878898
DO - 10.1109/APEDE.2016.7878898
M3 - Conference contribution
AN - SCOPUS:85017393629
VL - 1
BT - Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016
Y2 - 22 September 2016 through 23 September 2016
ER -