Standard

Reseach on how the size of the high-ohmic sections of the compact branch-line coupler affects its characteristics. / Letavin, D. A.
Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016. Том 1 Institute of Electrical and Electronics Engineers Inc., 2016. 7878896.

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Harvard

Letavin, DA 2016, Reseach on how the size of the high-ohmic sections of the compact branch-line coupler affects its characteristics. в Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016. Том. 1, 7878896, Institute of Electrical and Electronics Engineers Inc., 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016, Saratov, Российская Федерация, 22/09/2016. https://doi.org/10.1109/APEDE.2016.7878896

APA

Letavin, D. A. (2016). Reseach on how the size of the high-ohmic sections of the compact branch-line coupler affects its characteristics. в Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016 (Том 1). [7878896] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APEDE.2016.7878896

Vancouver

Letavin DA. Reseach on how the size of the high-ohmic sections of the compact branch-line coupler affects its characteristics. в Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016. Том 1. Institute of Electrical and Electronics Engineers Inc. 2016. 7878896 doi: 10.1109/APEDE.2016.7878896

Author

Letavin, D. A. / Reseach on how the size of the high-ohmic sections of the compact branch-line coupler affects its characteristics. Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016. Том 1 Institute of Electrical and Electronics Engineers Inc., 2016.

BibTeX

@inproceedings{882e7a32ef4b48a19c25bb866e644e76,
title = "Reseach on how the size of the high-ohmic sections of the compact branch-line coupler affects its characteristics",
author = "Letavin, {D. A.}",
year = "2016",
doi = "10.1109/APEDE.2016.7878896",
language = "English",
volume = "1",
booktitle = "Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",
note = "2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016 ; Conference date: 22-09-2016 Through 23-09-2016",

}

RIS

TY - GEN

T1 - Reseach on how the size of the high-ohmic sections of the compact branch-line coupler affects its characteristics

AU - Letavin, D. A.

PY - 2016

Y1 - 2016

UR - http://www.scopus.com/inward/record.url?scp=85017342227&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000405379200057

U2 - 10.1109/APEDE.2016.7878896

DO - 10.1109/APEDE.2016.7878896

M3 - Conference contribution

AN - SCOPUS:85017342227

VL - 1

BT - Conference Proceedings - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2016 International Conference on Actual Problems of Electron Devices Engineering, APEDE 2016

Y2 - 22 September 2016 through 23 September 2016

ER -

ID: 1762555