Standard

Measuring system for studying the frequency dependence of the complex permittivity of dielectric solids and bulk materials in the temperature range: book chapter. / Malkin, Alexander; Korotkov, Alexey; Chechetkin, Victor и др.
2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2022: book. Institute of Electrical and Electronics Engineers Inc., 2022. стр. 156-159.

Результаты исследований: Глава в книге, отчете, сборнике статей › Материалы конференции › Рецензирование

Harvard

Malkin, A, Korotkov, A, Chechetkin, V, Knyazev, N, Vakhitov, M & Klygach, D 2022, Measuring system for studying the frequency dependence of the complex permittivity of dielectric solids and bulk materials in the temperature range: book chapter. в 2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2022: book. Institute of Electrical and Electronics Engineers Inc., стр. 156-159, 2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON), 11/11/2022. https://doi.org/10.1109/SIBIRCON56155.2022.10017056

APA

Malkin, A., Korotkov, A., Chechetkin, V., Knyazev, N., Vakhitov, M., & Klygach, D. (2022). Measuring system for studying the frequency dependence of the complex permittivity of dielectric solids and bulk materials in the temperature range: book chapter. в 2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2022: book (стр. 156-159). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/SIBIRCON56155.2022.10017056

Vancouver

Malkin A, Korotkov A, Chechetkin V, Knyazev N, Vakhitov M, Klygach D. Measuring system for studying the frequency dependence of the complex permittivity of dielectric solids and bulk materials in the temperature range: book chapter. в 2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2022: book. Institute of Electrical and Electronics Engineers Inc. 2022. стр. 156-159 doi: 10.1109/SIBIRCON56155.2022.10017056

Author

Malkin, Alexander ; Korotkov, Alexey ; Chechetkin, Victor и др. / Measuring system for studying the frequency dependence of the complex permittivity of dielectric solids and bulk materials in the temperature range : book chapter. 2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2022: book. Institute of Electrical and Electronics Engineers Inc., 2022. стр. 156-159

BibTeX

@inproceedings{aa60b4c893e441a4a975cb76e84f1023,
title = "Measuring system for studying the frequency dependence of the complex permittivity of dielectric solids and bulk materials in the temperature range: book chapter",
abstract = "For electronic technology, it is necessary to have information about the electrodynamic parameters of the materials used at standard and high temperatures. Various methods and setups are used to heat material under test samples. The proposed design uses convection heating of the material placed in the measuring waveguide. Material characterization using a transmission line and a vector network analyzer allows one to obtain electrodynamic parameters of the material under test over a wide frequency range. The proposed setup makes it possible to determine the electrodynamic parameters of dielectrics with high precision. The algorithm for evaluating the complex dielectric permittivity is based on the Nicolson-Ross-Weir method. Raw method shows a large spread in the calculated electrodynamic parameters. It is necessary to consider the size change of the measuring line due to the temperature to obtain correct data. The paper shows that calculation of the effective dimensions of the waveguide influence the measurements results. {\textcopyright} 2022 IEEE.",
author = "Alexander Malkin and Alexey Korotkov and Victor Chechetkin and Nikolay Knyazev and Maxim Vakhitov and Denis Klygach",
note = "This work was carried out in South Ural State University (National Research University) with a financial support of the Russian Science Foundation (project No. 21-79-10115, https://rscf.ru/project/21-79-10115/).; 2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON) ; Conference date: 11-11-2022 Through 13-11-2022",
year = "2022",
month = nov,
day = "11",
doi = "10.1109/SIBIRCON56155.2022.10017056",
language = "English",
isbn = "978-166546480-2",
pages = "156--159",
booktitle = "2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2022",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
address = "United States",

}

RIS

TY - GEN

T1 - Measuring system for studying the frequency dependence of the complex permittivity of dielectric solids and bulk materials in the temperature range

T2 - 2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences (SIBIRCON)

AU - Malkin, Alexander

AU - Korotkov, Alexey

AU - Chechetkin, Victor

AU - Knyazev, Nikolay

AU - Vakhitov, Maxim

AU - Klygach, Denis

N1 - This work was carried out in South Ural State University (National Research University) with a financial support of the Russian Science Foundation (project No. 21-79-10115, https://rscf.ru/project/21-79-10115/).

PY - 2022/11/11

Y1 - 2022/11/11

N2 - For electronic technology, it is necessary to have information about the electrodynamic parameters of the materials used at standard and high temperatures. Various methods and setups are used to heat material under test samples. The proposed design uses convection heating of the material placed in the measuring waveguide. Material characterization using a transmission line and a vector network analyzer allows one to obtain electrodynamic parameters of the material under test over a wide frequency range. The proposed setup makes it possible to determine the electrodynamic parameters of dielectrics with high precision. The algorithm for evaluating the complex dielectric permittivity is based on the Nicolson-Ross-Weir method. Raw method shows a large spread in the calculated electrodynamic parameters. It is necessary to consider the size change of the measuring line due to the temperature to obtain correct data. The paper shows that calculation of the effective dimensions of the waveguide influence the measurements results. © 2022 IEEE.

AB - For electronic technology, it is necessary to have information about the electrodynamic parameters of the materials used at standard and high temperatures. Various methods and setups are used to heat material under test samples. The proposed design uses convection heating of the material placed in the measuring waveguide. Material characterization using a transmission line and a vector network analyzer allows one to obtain electrodynamic parameters of the material under test over a wide frequency range. The proposed setup makes it possible to determine the electrodynamic parameters of dielectrics with high precision. The algorithm for evaluating the complex dielectric permittivity is based on the Nicolson-Ross-Weir method. Raw method shows a large spread in the calculated electrodynamic parameters. It is necessary to consider the size change of the measuring line due to the temperature to obtain correct data. The paper shows that calculation of the effective dimensions of the waveguide influence the measurements results. © 2022 IEEE.

UR - http://www.scopus.com/inward/record.url?scp=85147519863&partnerID=8YFLogxK

U2 - 10.1109/SIBIRCON56155.2022.10017056

DO - 10.1109/SIBIRCON56155.2022.10017056

M3 - Conference contribution

SN - 978-166546480-2

SP - 156

EP - 159

BT - 2022 IEEE International Multi-Conference on Engineering, Computer and Information Sciences, SIBIRCON 2022

PB - Institute of Electrical and Electronics Engineers Inc.

Y2 - 11 November 2022 through 13 November 2022

ER -

ID: 51471703