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Low-energy charge transfer excitations in NiO. / Sokolov, V. I.; Pustovarov, V. A.; Churmanov, V. N. и др.
INTERNATIONAL CONFERENCE ON FUNCTIONAL MATERIALS AND NANOTECHNOLOGIES (FM&NT2012). Том 38 Institute of Physics Publishing (IOP), 2012. (IOP Conference Series-Materials Science and Engineering; Том 38).

Результаты исследований: Глава в книге, отчете, сборнике статейМатериалы конференцииРецензирование

Harvard

Sokolov, VI, Pustovarov, VA, Churmanov, VN, Ivanov, VY, Yermakov, AY, Uimin, MA, Gruzdev, NB, Sokolov, PS, Baranov, AN & Moskvin, AS 2012, Low-energy charge transfer excitations in NiO. в INTERNATIONAL CONFERENCE ON FUNCTIONAL MATERIALS AND NANOTECHNOLOGIES (FM&NT2012). Том. 38, IOP Conference Series-Materials Science and Engineering, Том. 38, Institute of Physics Publishing (IOP), International Conference on Functional Materials and Nanotechnologies (FMandNT), Riga, Латвия, 17/04/2012. https://doi.org/10.1088/1757-899X/38/1/012007

APA

Sokolov, V. I., Pustovarov, V. A., Churmanov, V. N., Ivanov, V. Y., Yermakov, A. Y., Uimin, M. A., Gruzdev, N. B., Sokolov, P. S., Baranov, A. N., & Moskvin, A. S. (2012). Low-energy charge transfer excitations in NiO. в INTERNATIONAL CONFERENCE ON FUNCTIONAL MATERIALS AND NANOTECHNOLOGIES (FM&NT2012) (Том 38). (IOP Conference Series-Materials Science and Engineering; Том 38). Institute of Physics Publishing (IOP). https://doi.org/10.1088/1757-899X/38/1/012007

Vancouver

Sokolov VI, Pustovarov VA, Churmanov VN, Ivanov VY, Yermakov AY, Uimin MA и др. Low-energy charge transfer excitations in NiO. в INTERNATIONAL CONFERENCE ON FUNCTIONAL MATERIALS AND NANOTECHNOLOGIES (FM&NT2012). Том 38. Institute of Physics Publishing (IOP). 2012. (IOP Conference Series-Materials Science and Engineering). doi: 10.1088/1757-899X/38/1/012007

Author

Sokolov, V. I. ; Pustovarov, V. A. ; Churmanov, V. N. и др. / Low-energy charge transfer excitations in NiO. INTERNATIONAL CONFERENCE ON FUNCTIONAL MATERIALS AND NANOTECHNOLOGIES (FM&NT2012). Том 38 Institute of Physics Publishing (IOP), 2012. (IOP Conference Series-Materials Science and Engineering).

BibTeX

@inproceedings{ff95a7877f444d43a02492f6d99b03db,
title = "Low-energy charge transfer excitations in NiO",
keywords = "OPTICAL-PROPERTIES, ELECTRONIC-STRUCTURE, ELECTROREFLECTANCE, OXIDE, ZNO",
author = "Sokolov, {V. I.} and Pustovarov, {V. A.} and Churmanov, {V. N.} and Ivanov, {V. Yu} and Yermakov, {A. Ye} and Uimin, {M. A.} and Gruzdev, {N. B.} and Sokolov, {P. S.} and Baranov, {A. N.} and Moskvin, {A. S.}",
year = "2012",
doi = "10.1088/1757-899X/38/1/012007",
language = "English",
volume = "38",
series = "IOP Conference Series-Materials Science and Engineering",
publisher = "Institute of Physics Publishing (IOP)",
booktitle = "INTERNATIONAL CONFERENCE ON FUNCTIONAL MATERIALS AND NANOTECHNOLOGIES (FM&NT2012)",
address = "United Kingdom",
note = "International Conference on Functional Materials and Nanotechnologies (FMandNT) ; Conference date: 17-04-2012 Through 20-04-2012",

}

RIS

TY - GEN

T1 - Low-energy charge transfer excitations in NiO

AU - Sokolov, V. I.

AU - Pustovarov, V. A.

AU - Churmanov, V. N.

AU - Ivanov, V. Yu

AU - Yermakov, A. Ye

AU - Uimin, M. A.

AU - Gruzdev, N. B.

AU - Sokolov, P. S.

AU - Baranov, A. N.

AU - Moskvin, A. S.

PY - 2012

Y1 - 2012

KW - OPTICAL-PROPERTIES

KW - ELECTRONIC-STRUCTURE

KW - ELECTROREFLECTANCE

KW - OXIDE

KW - ZNO

UR - http://www.scopus.com/inward/record.url?scp=84874086273&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000309665200007

U2 - 10.1088/1757-899X/38/1/012007

DO - 10.1088/1757-899X/38/1/012007

M3 - Conference contribution

AN - SCOPUS:84874086273

VL - 38

T3 - IOP Conference Series-Materials Science and Engineering

BT - INTERNATIONAL CONFERENCE ON FUNCTIONAL MATERIALS AND NANOTECHNOLOGIES (FM&NT2012)

PB - Institute of Physics Publishing (IOP)

T2 - International Conference on Functional Materials and Nanotechnologies (FMandNT)

Y2 - 17 April 2012 through 20 April 2012

ER -

ID: 1595521