TY - JOUR

T1 - Influence of light, heat and humidity on MAPbI3/Si interface stability

AU - Zhidkov, Ivan

AU - Yu, Ming-Hsuan

AU - Kukharenko, Andrey

AU - Cholakh, Seif

AU - Chueh, Chu-Chen

AU - Kurmaev, Ernst

PY - 2024

Y1 - 2024

N2 - X-ray photoelectron spectroscopy (XPS) was used to examine the MAPbI3/Si interface (MA = methylammonium) before and after 45 days of exposure to light, heat stress at 85 °C or 50% relative humidity (RH). From the survey XPS spectra it follows that under these external influences, changes in the I/Pb ratio, indicating the presence of the PbI2 phase as a degradation product, do not go beyond 12%. These results were confirmed by measurements of high-resolution XPS spectra in the energy ranges of Pb 4f, I 3d and valence band signals, which do not show significant high-energy shifts towards the energy position of the PbI2 reference spectra. © 2024.

AB - X-ray photoelectron spectroscopy (XPS) was used to examine the MAPbI3/Si interface (MA = methylammonium) before and after 45 days of exposure to light, heat stress at 85 °C or 50% relative humidity (RH). From the survey XPS spectra it follows that under these external influences, changes in the I/Pb ratio, indicating the presence of the PbI2 phase as a degradation product, do not go beyond 12%. These results were confirmed by measurements of high-resolution XPS spectra in the energy ranges of Pb 4f, I 3d and valence band signals, which do not show significant high-energy shifts towards the energy position of the PbI2 reference spectra. © 2024.

UR - http://www.scopus.com/inward/record.url?partnerID=8YFLogxK&scp=85189689044

U2 - 10.1016/j.mencom.2024.02.023

DO - 10.1016/j.mencom.2024.02.023

M3 - Article

VL - 34

SP - 229

EP - 231

JO - Mendeleev Communications

JF - Mendeleev Communications

SN - 0959-9436

IS - 2

ER -