An automated system for measuring the impedance of polymer films

Standard

An automated system for measuring the impedance of polymer films. / Shcherbinin, S. V.; Safronov, A. P.; Krekhno, R. V. и др.
в: Russian Journal of Nondestructive Testing, Том 53, № 2, 01.02.2017, стр. 111-116.

Результаты исследований: Вклад в журнал › Статья › Рецензирование

BibTeX

@article{093b063e57754f4cbc5409eded2465b9,

title = "An automated system for measuring the impedance of polymer films",

keywords = "composite polymers, dielectric spectroscopy, impedance, metal nanoparticles",

author = "Shcherbinin, {S. V.} and Safronov, {A. P.} and Krekhno, {R. V.} and Beketova, {A. I.}",

year = "2017",

month = feb,

day = "1",

doi = "10.1134/S106183091702005X",

language = "English",

volume = "53",

pages = "111--116",

journal = "Russian Journal of Nondestructive Testing",

issn = "1061-8309",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "2",

}

RIS

TY - JOUR

T1 - An automated system for measuring the impedance of polymer films

AU - Shcherbinin, S. V.

AU - Safronov, A. P.

AU - Krekhno, R. V.

AU - Beketova, A. I.

PY - 2017/2/1

Y1 - 2017/2/1

KW - composite polymers

KW - dielectric spectroscopy

KW - impedance

KW - metal nanoparticles

UR - http://www.scopus.com/inward/record.url?scp=85018312272&partnerID=8YFLogxK

UR - https://elibrary.ru/item.asp?id=31036751

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000403006000004

U2 - 10.1134/S106183091702005X

DO - 10.1134/S106183091702005X

M3 - Article

AN - SCOPUS:85018312272

VL - 53

SP - 111

EP - 116

JO - Russian Journal of Nondestructive Testing

JF - Russian Journal of Nondestructive Testing

SN - 1061-8309

IS - 2

ER -

ID: 1812787