ОСОБЕННОСТИ ГРАДУИРОВКИ РЕНТГЕНОФЛУОРЕСЦЕНТНОГО СПЕКТРОМЕТРА С ПОЛНЫМ ВНЕШНИМ ОТРАЖЕНИЕМ "NANOHUNTER" С ИСПОЛЬЗОВАНИЕМ СТАНДАРТНЫХ ОБРАЗЦОВ РАСТВОРОВ ЭЛЕМЕНТОВ

Standard

ОСОБЕННОСТИ ГРАДУИРОВКИ РЕНТГЕНОФЛУОРЕСЦЕНТНОГО СПЕКТРОМЕТРА С ПОЛНЫМ ВНЕШНИМ ОТРАЖЕНИЕМ "NANOHUNTER" С ИСПОЛЬЗОВАНИЕМ СТАНДАРТНЫХ ОБРАЗЦОВ РАСТВОРОВ ЭЛЕМЕНТОВ. / Кулеш, Н. А.; Собина, Е. П.; Васьковский, В. О. и др.
в: Стандартные образцы, № 4, 2013, стр. 25-29.

Результаты исследований: Вклад в журнал › Статья › Рецензирование

BibTeX

@article{a82114ae3a224b16be5e0449c03b41b9,

title = "ОСОБЕННОСТИ ГРАДУИРОВКИ РЕНТГЕНОФЛУОРЕСЦЕНТНОГО СПЕКТРОМЕТРА С ПОЛНЫМ ВНЕШНИМ ОТРАЖЕНИЕМ {"}NANOHUNTER{"} С ИСПОЛЬЗОВАНИЕМ СТАНДАРТНЫХ ОБРАЗЦОВ РАСТВОРОВ ЭЛЕМЕНТОВ",

abstract = "Although X-ray fluorescence spectrometry (XRF) is well-established and widely used technique for elemental analysis, XRF devices with total external reflection (TXRF) only recently became available for research and industrial laboratories. As the number of TXRF devices in use rises, the problems related to certification, calibration and standardization become more important. In this contribution we describe major steps of sample preparation, interpretation of the results obtained and graduation of the device. The study was performed on standard multielement solutions using TXRF spectrometer Nanohunter, manufactured by Rigaku Corp.",

author = "Кулеш, {Н. А.} and Собина, {Е. П.} and Васьковский, {В. О.} and Коротнев, {М. О.}",

year = "2013",

language = "Русский",

pages = "25--29",

journal = "Стандартные образцы",

issn = "2077-1177",

publisher = "Федеральное государственное унитарное предприятие {"}Уральский научно-исследовательский институт метрологии{"}",

number = "4",

}

RIS

TY - JOUR

T1 - ОСОБЕННОСТИ ГРАДУИРОВКИ РЕНТГЕНОФЛУОРЕСЦЕНТНОГО СПЕКТРОМЕТРА С ПОЛНЫМ ВНЕШНИМ ОТРАЖЕНИЕМ "NANOHUNTER" С ИСПОЛЬЗОВАНИЕМ СТАНДАРТНЫХ ОБРАЗЦОВ РАСТВОРОВ ЭЛЕМЕНТОВ

AU - Кулеш, Н. А.

AU - Собина, Е. П.

AU - Васьковский, В. О.

AU - Коротнев, М. О.

PY - 2013

Y1 - 2013

N2 - Although X-ray fluorescence spectrometry (XRF) is well-established and widely used technique for elemental analysis, XRF devices with total external reflection (TXRF) only recently became available for research and industrial laboratories. As the number of TXRF devices in use rises, the problems related to certification, calibration and standardization become more important. In this contribution we describe major steps of sample preparation, interpretation of the results obtained and graduation of the device. The study was performed on standard multielement solutions using TXRF spectrometer Nanohunter, manufactured by Rigaku Corp.

AB - Although X-ray fluorescence spectrometry (XRF) is well-established and widely used technique for elemental analysis, XRF devices with total external reflection (TXRF) only recently became available for research and industrial laboratories. As the number of TXRF devices in use rises, the problems related to certification, calibration and standardization become more important. In this contribution we describe major steps of sample preparation, interpretation of the results obtained and graduation of the device. The study was performed on standard multielement solutions using TXRF spectrometer Nanohunter, manufactured by Rigaku Corp.

UR - https://elibrary.ru/item.asp?id=21155688

M3 - Статья

SP - 25

EP - 29

JO - Стандартные образцы

JF - Стандартные образцы

SN - 2077-1177

IS - 4

ER -

ID: 8241517