The role of substrates of different natures on the phase composition, morphology, and mechanical stresses at the “film–substrate” interface during the chemical deposition of CdPbS layers on silicon (111), glass ceramics, fused quartz, an indium–tin–oxide (ITO) coating, slide glass, and porous glass is studied. It is assumed that the revealed features are associated with different conditions of film nucleation and growth. It is found that a single-phase Cd_ x Pb_1 – _ x S solid solution film is formed on fused quartz, in contrast to other substrates on which layers containing additionally from 2 to 8 mol % of the X-ray amorphous CdS phase are deposited. It is shown that an increase in mechanical compressive stresses at the “film–substrate” interface from –9.32 to –121.79 kN/m^2 in the series porous glass–object glass–glass ceramics–silicon (111)–fused silica is asymbatic to the thermal-expansion coefficients of these substrate materials.