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Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys. / Kalienko, M. S.; Volkov, A. V.; Zhelnina, A. V.
In: Crystallography Reports, Vol. 65, No. 3, 01.05.2020, p. 412-416.

Research output: Contribution to journal › Article › peer-review

Harvard

Kalienko, MS, Volkov, AV & Zhelnina, AV 2020, 'Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys', Crystallography Reports, vol. 65, no. 3, pp. 412-416. https://doi.org/10.1134/S1063774520020121

APA

Kalienko, M. S., Volkov, A. V., & Zhelnina, A. V. (2020). Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys. Crystallography Reports, 65(3), 412-416. https://doi.org/10.1134/S1063774520020121

Vancouver

Kalienko MS, Volkov AV, Zhelnina AV. Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys. Crystallography Reports. 2020 May 1;65(3):412-416. doi: 10.1134/S1063774520020121

Author

Kalienko, M. S. ; Volkov, A. V. ; Zhelnina, A. V. / Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys. In: Crystallography Reports. 2020 ; Vol. 65, No. 3. pp. 412-416.

BibTeX

@article{e806c98da4ad4c25a0cacdf700e52b8c,
title = "Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys",
keywords = "LINE-BROADENING ANALYSIS, MECHANICAL-PROPERTIES, CRYSTALLITE SIZE, BETA, DIFFRACTION, TI, MICROSTRUCTURE, TRANSFORMATION, TEMPERATURE, KINETICS",
author = "Kalienko, {M. S.} and Volkov, {A. V.} and Zhelnina, {A. V.}",
year = "2020",
month = may,
day = "1",
doi = "10.1134/S1063774520020121",
language = "English",
volume = "65",
pages = "412--416",
journal = "Crystallography Reports",
issn = "1063-7745",
publisher = "Maik Nauka-Interperiodica Publishing",
number = "3",

}

RIS

TY - JOUR

T1 - Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys

AU - Kalienko, M. S.

AU - Volkov, A. V.

AU - Zhelnina, A. V.

PY - 2020/5/1

Y1 - 2020/5/1

KW - LINE-BROADENING ANALYSIS

KW - MECHANICAL-PROPERTIES

KW - CRYSTALLITE SIZE

KW - BETA

KW - DIFFRACTION

KW - TI

KW - MICROSTRUCTURE

KW - TRANSFORMATION

KW - TEMPERATURE

KW - KINETICS

UR - http://www.scopus.com/inward/record.url?scp=85085475640&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000536643700018

UR - https://www.elibrary.ru/item.asp?id=43284023

U2 - 10.1134/S1063774520020121

DO - 10.1134/S1063774520020121

M3 - Article

AN - SCOPUS:85085475640

VL - 65

SP - 412

EP - 416

JO - Crystallography Reports

JF - Crystallography Reports

SN - 1063-7745

IS - 3

ER -

ID: 12911316