Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys › Research Explorer

Use of Full-Profile X-Ray Analysis for Estimation of the Dispersity of the Secondary Alpha Phase in High-Strength Titanium Alloys

Research output: Contribution to journal › Article › peer-review

DOI

https://doi.org/10.1134/S1063774520020121
Final published version

Original language	English
Pages (from-to)	412-416
Number of pages	5
Journal	Crystallography Reports
Volume	65
Issue number	3
DOIs	https://doi.org/10.1134/S1063774520020121
Publication status	Published - 1 May 2020

GRNTI

29.00.00 PHYSICS

ASJC Scopus subject areas

Condensed Matter Physics
Chemistry(all)
Materials Science(all)

Level of Research Output

VAK List

Research areas

LINE-BROADENING ANALYSIS, MECHANICAL-PROPERTIES, CRYSTALLITE SIZE, BETA, DIFFRACTION, TI, MICROSTRUCTURE, TRANSFORMATION, TEMPERATURE, KINETICS

WoS ResearchAreas Categories

Crystallography

ID: 12911316