Standard

New approach to analysis of the switching current data, recorded during conventional hysteresis measurements. / Shur, V. Ya.; Baturin, I. S.; Shishkin, E. I. et al.
In: Integrated Ferroelectrics, Vol. 53, 01.12.2003, p. 379-390.

Research output: Contribution to journal › Article › peer-review

Harvard

Shur, VY, Baturin, IS, Shishkin, EI & Belousova, MV 2003, 'New approach to analysis of the switching current data, recorded during conventional hysteresis measurements', Integrated Ferroelectrics, vol. 53, pp. 379-390. https://doi.org/10.1080/10584580390258327

APA

Shur, V. Y., Baturin, I. S., Shishkin, E. I., & Belousova, M. V. (2003). New approach to analysis of the switching current data, recorded during conventional hysteresis measurements. Integrated Ferroelectrics, 53, 379-390. https://doi.org/10.1080/10584580390258327

Vancouver

Shur VY, Baturin IS, Shishkin EI, Belousova MV. New approach to analysis of the switching current data, recorded during conventional hysteresis measurements. Integrated Ferroelectrics. 2003 Dec 1;53:379-390. doi: 10.1080/10584580390258327

Author

Shur, V. Ya. ; Baturin, I. S. ; Shishkin, E. I. et al. / New approach to analysis of the switching current data, recorded during conventional hysteresis measurements. In: Integrated Ferroelectrics. 2003 ; Vol. 53. pp. 379-390.

BibTeX

@article{e195aac23f0e4b43b7f9e5683b96c2e9,
title = "New approach to analysis of the switching current data, recorded during conventional hysteresis measurements",
keywords = "Fatigue, Ferroelectric thin films, PLZT, PZT, Switching current analysis",
author = "Shur, {V. Ya.} and Baturin, {I. S.} and Shishkin, {E. I.} and Belousova, {M. V.}",
year = "2003",
month = dec,
day = "1",
doi = "10.1080/10584580390258327",
language = "English",
volume = "53",
pages = "379--390",
journal = "Integrated Ferroelectrics",
issn = "1058-4587",
publisher = "Gordon and Breach Science Publishers",

}

RIS

TY - JOUR

T1 - New approach to analysis of the switching current data, recorded during conventional hysteresis measurements

AU - Shur, V. Ya.

AU - Baturin, I. S.

AU - Shishkin, E. I.

AU - Belousova, M. V.

PY - 2003/12/1

Y1 - 2003/12/1

KW - Fatigue

KW - Ferroelectric thin films

KW - PLZT

KW - PZT

KW - Switching current analysis

UR - http://www.scopus.com/inward/record.url?scp=13744258954&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000187624500016

U2 - 10.1080/10584580390258327

DO - 10.1080/10584580390258327

M3 - Article

AN - SCOPUS:13744258954

VL - 53

SP - 379

EP - 390

JO - Integrated Ferroelectrics

JF - Integrated Ferroelectrics

SN - 1058-4587

ER -

ID: 7207004