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New approach to analysis of the switching current data, recorded during conventional hysteresis measurements
Research output
:
Contribution to journal
›
Article
›
peer-review
Section of Optoelectronics and Semiconductor Technology
Ural Multiple Access Center 'Modern Nanotechnologies"
Institute of Natural Sciences and Mathematics
Overview
Cite this
DOI
https://doi.org/10.1080/10584580390258327
Final published version
V. Ya. Shur
I. S. Baturin
E. I. Shishkin
M. V. Belousova
Original language
English
Pages (from-to)
379-390
Number of pages
12
Journal
Integrated Ferroelectrics
Volume
53
DOIs
https://doi.org/10.1080/10584580390258327
Publication status
Published -
1 Dec 2003
Research areas
Fatigue, Ferroelectric thin films, PLZT, PZT, Switching current analysis
ASJC Scopus subject areas
Control and Systems Engineering
Electronic, Optical and Magnetic Materials
Ceramics and Composites
Condensed Matter Physics
Materials Chemistry
Electrical and Electronic Engineering
WoS ResearchAreas Categories
Engineering, Electrical & Electronic
Physics, Applied
Physics, Condensed Matter
ID: 7207004