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New approach to analysis of the switching current data in ferroelectric thin films. / Shur, V. Ya.; Baturin, I. S.; Shishkin, E. I. et al.
In: Ferroelectrics, Vol. 291, 01.06.2003, p. 27-35.

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Shur VY, Baturin IS, Shishkin EI, Belousova MV. New approach to analysis of the switching current data in ferroelectric thin films. Ferroelectrics. 2003 Jun 1;291:27-35. doi: 10.1080/00150190390222510

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BibTeX

@article{6849fe8d67af4d8e9f4e297f07a7c7e9,
title = "New approach to analysis of the switching current data in ferroelectric thin films",
keywords = "Internal bias field, Preisach approach, Switching current, Thin films",
author = "Shur, {V. Ya.} and Baturin, {I. S.} and Shishkin, {E. I.} and Belousova, {M. V.}",
year = "2003",
month = jun,
day = "1",
doi = "10.1080/00150190390222510",
language = "English",
volume = "291",
pages = "27--35",
journal = "Ferroelectrics",
issn = "0015-0193",
publisher = "Taylor and Francis Ltd.",

}

RIS

TY - JOUR

T1 - New approach to analysis of the switching current data in ferroelectric thin films

AU - Shur, V. Ya.

AU - Baturin, I. S.

AU - Shishkin, E. I.

AU - Belousova, M. V.

PY - 2003/6/1

Y1 - 2003/6/1

KW - Internal bias field

KW - Preisach approach

KW - Switching current

KW - Thin films

UR - http://www.scopus.com/inward/record.url?scp=13744250409&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000185296200005

U2 - 10.1080/00150190390222510

DO - 10.1080/00150190390222510

M3 - Article

AN - SCOPUS:13744250409

VL - 291

SP - 27

EP - 35

JO - Ferroelectrics

JF - Ferroelectrics

SN - 0015-0193

ER -

ID: 7207225