New approach to analysis of the switching current data in ferroelectric thin films › Research Explorer

DOI

https://doi.org/10.1080/00150190390222510
Final published version

Original language	English
Pages (from-to)	27-35
Number of pages	9
Journal	Ferroelectrics
Volume	291
DOIs	https://doi.org/10.1080/00150190390222510
Publication status	Published - 1 Jun 2003

Research areas

Internal bias field, Preisach approach, Switching current, Thin films

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

WoS ResearchAreas Categories

Materials Science, Multidisciplinary
Physics, Condensed Matter

ID: 7207225