Formation of broad domain boundary during dot ion beam irradiation in SBN:Ni single crystals › Research Explorer

DOI

https://doi.org/10.1080/00150193.2022.2052248
Final published version

Original language	English
Pages (from-to)	72-82
Number of pages	11
Journal	Ferroelectrics
Volume	592
Issue number	1
DOIs	https://doi.org/10.1080/00150193.2022.2052248
Publication status	Published - 2022

WoS ResearchAreas Categories

Materials Science, Multidisciplinary
Physics, Condensed Matter

Research areas

Ion beam irradiation, local switching, piezoresponse force microscopy, relaxor ferroelectrics, second-harmonic generation microscopy, strontium barium niobate

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

ID: 30625492