Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Original language | English |
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Title of host publication | Optical Measurement Systems for Industrial Inspection X |
Editors | P Lehmann, W Osten, AA Goncalves |
Publisher | SPIE International Optical Engineering |
Number of pages | 6 |
Volume | 10329 |
ISBN (Electronic) | 9781510611030 |
ISBN (Print) | 978-1-5106-1103-0 |
DOIs | |
Publication status | Published - 2017 |
Event | Conference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium - Munich, Germany Duration: 26 Jun 2017 → 29 Jun 2017 |
Name | Proceedings of SPIE |
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Publisher | SPIE-INT SOC OPTICAL ENGINEERING |
Volume | 10329 |
ISSN (Print) | 0277-786X |
Conference | Conference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium |
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Country/Territory | Germany |
City | Munich |
Period | 26/06/2017 → 29/06/2017 |
ID: 2040089