DOI

  • Goran Maconi
  • Ivan Kassamakov
  • Antti Penttila
  • Maria Gritsevich
  • Edward Haeggstrom
  • Karri Muinonen
Original languageEnglish
Title of host publicationOptical Measurement Systems for Industrial Inspection X
EditorsP Lehmann, W Osten, AA Goncalves
PublisherSPIE International Optical Engineering
Number of pages6
Volume10329
ISBN (Electronic)9781510611030
ISBN (Print)978-1-5106-1103-0
DOIs
Publication statusPublished - 2017
EventConference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium - Munich, Germany
Duration: 26 Jun 201729 Jun 2017

Publication series

NameProceedings of SPIE
PublisherSPIE-INT SOC OPTICAL ENGINEERING
Volume10329
ISSN (Print)0277-786X

Conference

ConferenceConference on Optical Measurement Systems for Industrial Inspection X part of the SPIE Optical Metrology Symposium
Country/TerritoryGermany
CityMunich
Period26/06/201729/06/2017

    WoS ResearchAreas Categories

  • Instruments & Instrumentation
  • Optics

    Research areas

  • light scattering, polarized reflectance, calibration, optical properties

    ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

ID: 2040089