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  1. 2014

  2. Low Energy Electron Emission from Surface-Interface States of SiO2:Ge Films

    Zatsepin, A. F., Buntov, E. A., Mikhailovich, A. P., Slesarev, A. I., Fitting, H. -J. & Schmidt, B., 2014, FUNDAMENTALS AND APPLICATIONS IN SILICA AND ADVANCED DIELECTRICS (SIO2014). Carbonaro, CM. & Ricci, PC. (eds.). American Institute of Physics Publising LLC, p. 179-184 6 p. (AIP Conference Proceedings; vol. 1624).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  3. Structure and vibrations of different charge Ge impurity in alpha-quartz

    Kislov, A. N., Mikhailovich, A. P. & Zatsepin, A. F., 2014, FUNDAMENTALS AND APPLICATIONS IN SILICA AND ADVANCED DIELECTRICS (SIO2014). Carbonaro, CM. & Ricci, PC. (eds.). American Institute of Physics Publising LLC, p. 64-68 5 p. (AIP Conference Proceedings; vol. 1624).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

  4. 2013

  5. Экологический фотомониторинг естественных и антропогенных ландшафтов

    Фомин, В. В. & Михайлович, А. П., 2013, In: Аграрный вестник Урала. 11(117), p. 16-21

    Research output: Contribution to journal › Article › peer-review

  6. 2008

  7. Metrological aspects of image analysis

    Fomin, V. V., Mikhailovich, A. P., Popov, A. S., Nizametdinov, N. F. & Shalaumova, Y. V., 2008, In: Measurement Techniques. 51, 2, p. 146-151 6 p.

    Research output: Contribution to journal › Article › peer-review

  8. 2004

  9. A photo-thermally stimulated exoemission technique used to study the properties of HTSC ceramics based on YBa2Cu3O 7-δ

    Syurdo, A. I., Kortov, V. S., Mil'Man, I. I., Slesarev, A. I. & Mikhailovich, A. P., Dec 2004, In: Russian Journal of Nondestructive Testing. 40, 12, p. 830-833 4 p.

    Research output: Contribution to journal › Article › peer-review

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