The detection of flaws in optoelectronic systems (vol 48, pg 426, 2012)

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The detection of flaws in optoelectronic systems (vol 48, pg 426, 2012). / Budai, B. T.; Porodnov, B. T.; Myakutina, I. V. et al.
In: Russian Journal of Nondestructive Testing, Vol. 48, No. 9, 09.2012, p. 553-553.

Research output: Contribution to journal › Article › peer-review

BibTeX

@article{e145dd88d4134c44a127d47102fc7b07,

title = "The detection of flaws in optoelectronic systems (vol 48, pg 426, 2012)",

author = "Budai, {B. T.} and Porodnov, {B. T.} and Myakutina, {I. V.} and Kasatkin, {N. V.}",

year = "2012",

month = sep,

doi = "10.1134/S1061830912090094",

language = "English",

volume = "48",

pages = "553--553",

journal = "Russian Journal of Nondestructive Testing",

issn = "1061-8309",

publisher = "Maik Nauka-Interperiodica Publishing",

number = "9",

}

RIS

TY - JOUR

T1 - The detection of flaws in optoelectronic systems (vol 48, pg 426, 2012)

AU - Budai, B. T.

AU - Porodnov, B. T.

AU - Myakutina, I. V.

AU - Kasatkin, N. V.

PY - 2012/9

Y1 - 2012/9

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000312589200008

U2 - 10.1134/S1061830912090094

DO - 10.1134/S1061830912090094

M3 - Article

VL - 48

SP - 553

EP - 553

JO - Russian Journal of Nondestructive Testing

JF - Russian Journal of Nondestructive Testing

SN - 1061-8309

IS - 9

ER -

ID: 1139017