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System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures. / Shcherbinin, S. V.; Volchkov, S. O.; Lepalovskii, V. N. et al.
In: Russian Journal of Nondestructive Testing, Vol. 53, No. 3, 01.03.2017, p. 204-212.

Research output: Contribution to journal › Article › peer-review

Harvard

Shcherbinin, SV, Volchkov, SO, Lepalovskii, VN, Chlenova, AA & Kurlyandskaya, GV 2017, 'System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures', Russian Journal of Nondestructive Testing, vol. 53, no. 3, pp. 204-212. https://doi.org/10.1134/S1061830917030093

APA

Shcherbinin, S. V., Volchkov, S. O., Lepalovskii, V. N., Chlenova, A. A., & Kurlyandskaya, G. V. (2017). System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures. Russian Journal of Nondestructive Testing, 53(3), 204-212. https://doi.org/10.1134/S1061830917030093

Vancouver

Shcherbinin SV, Volchkov SO, Lepalovskii VN, Chlenova AA, Kurlyandskaya GV. System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures. Russian Journal of Nondestructive Testing. 2017 Mar 1;53(3):204-212. doi: 10.1134/S1061830917030093

Author

Shcherbinin, S. V. ; Volchkov, S. O. ; Lepalovskii, V. N. et al. / System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures. In: Russian Journal of Nondestructive Testing. 2017 ; Vol. 53, No. 3. pp. 204-212.

BibTeX

@article{9cb049af317c4727a62e18b256e37f18,
title = "System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures",
keywords = "EPR spectroscopy, ferromagnetic resonance, magnetic field sensors, microwave radiation, thin magnetic films, vector network analysis",
author = "Shcherbinin, {S. V.} and Volchkov, {S. O.} and Lepalovskii, {V. N.} and Chlenova, {A. A.} and Kurlyandskaya, {G. V.}",
year = "2017",
month = mar,
day = "1",
doi = "10.1134/S1061830917030093",
language = "English",
volume = "53",
pages = "204--212",
journal = "Russian Journal of Nondestructive Testing",
issn = "1061-8309",
publisher = "Maik Nauka-Interperiodica Publishing",
number = "3",

}

RIS

TY - JOUR

T1 - System based on a ZVA-67 vector network analyzer for measuring high-frequency parameters of magnetic film structures

AU - Shcherbinin, S. V.

AU - Volchkov, S. O.

AU - Lepalovskii, V. N.

AU - Chlenova, A. A.

AU - Kurlyandskaya, G. V.

PY - 2017/3/1

Y1 - 2017/3/1

KW - EPR spectroscopy

KW - ferromagnetic resonance

KW - magnetic field sensors

KW - microwave radiation

KW - thin magnetic films

KW - vector network analysis

UR - http://www.scopus.com/inward/record.url?scp=85021407793&partnerID=8YFLogxK

UR - https://elibrary.ru/item.asp?id=31049705

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000403005800005

U2 - 10.1134/S1061830917030093

DO - 10.1134/S1061830917030093

M3 - Article

AN - SCOPUS:85021407793

VL - 53

SP - 204

EP - 212

JO - Russian Journal of Nondestructive Testing

JF - Russian Journal of Nondestructive Testing

SN - 1061-8309

IS - 3

ER -

ID: 1927878