Standard

Substrate thickness impact to branch-line coupler miniaturization for low pass filters. / Letavin, Denis A.; Konovalov, Alexei L.
2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1. Vol. 1 IEEE Computer Society, 2016. p. 454-456 7802201 (International Conference on Actual Problems of Electronic Instrument Engineering).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Harvard

Letavin, DA & Konovalov, AL 2016, Substrate thickness impact to branch-line coupler miniaturization for low pass filters. in 2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1. vol. 1, 7802201, International Conference on Actual Problems of Electronic Instrument Engineering, IEEE Computer Society, pp. 454-456, 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE), Novosibirsk, 03/10/2016. https://doi.org/10.1109/APEIE.2016.7802201

APA

Letavin, D. A., & Konovalov, A. L. (2016). Substrate thickness impact to branch-line coupler miniaturization for low pass filters. In 2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1 (Vol. 1, pp. 454-456). [7802201] (International Conference on Actual Problems of Electronic Instrument Engineering). IEEE Computer Society. https://doi.org/10.1109/APEIE.2016.7802201

Vancouver

Letavin DA, Konovalov AL. Substrate thickness impact to branch-line coupler miniaturization for low pass filters. In 2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1. Vol. 1. IEEE Computer Society. 2016. p. 454-456. 7802201. (International Conference on Actual Problems of Electronic Instrument Engineering). doi: 10.1109/APEIE.2016.7802201

Author

Letavin, Denis A. ; Konovalov, Alexei L. / Substrate thickness impact to branch-line coupler miniaturization for low pass filters. 2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1. Vol. 1 IEEE Computer Society, 2016. pp. 454-456 (International Conference on Actual Problems of Electronic Instrument Engineering).

BibTeX

@inproceedings{8a2d8898e1284588a5381a6cda50a6c6,
title = "Substrate thickness impact to branch-line coupler miniaturization for low pass filters",
keywords = "miniaturization, microstrip line, lowpass filter, branch-line coupler, COMPACT-SIZE, RAT-RACE",
author = "Letavin, {Denis A.} and Konovalov, {Alexei L.}",
year = "2016",
month = dec,
day = "29",
doi = "10.1109/APEIE.2016.7802201",
language = "English",
volume = "1",
series = "International Conference on Actual Problems of Electronic Instrument Engineering",
publisher = "IEEE Computer Society",
pages = "454--456",
booktitle = "2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1",
address = "United States",
note = "13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) ; Conference date: 03-10-2016 Through 06-10-2016",

}

RIS

TY - GEN

T1 - Substrate thickness impact to branch-line coupler miniaturization for low pass filters

AU - Letavin, Denis A.

AU - Konovalov, Alexei L.

PY - 2016/12/29

Y1 - 2016/12/29

KW - miniaturization

KW - microstrip line

KW - lowpass filter

KW - branch-line coupler

KW - COMPACT-SIZE

KW - RAT-RACE

UR - http://www.scopus.com/inward/record.url?scp=85020706383&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000392622500117

U2 - 10.1109/APEIE.2016.7802201

DO - 10.1109/APEIE.2016.7802201

M3 - Conference contribution

VL - 1

T3 - International Conference on Actual Problems of Electronic Instrument Engineering

SP - 454

EP - 456

BT - 2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1

PB - IEEE Computer Society

T2 - 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)

Y2 - 3 October 2016 through 6 October 2016

ER -

ID: 1618013