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Substrate permittivity impact to branch-line couplers miniaturization. / Letavin, Denis A.
2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1. Vol. 1 IEEE Computer Society, 2016. p. 451-453 7802200 (International Conference on Actual Problems of Electronic Instrument Engineering).

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Harvard

Letavin, DA 2016, Substrate permittivity impact to branch-line couplers miniaturization. in 2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1. vol. 1, 7802200, International Conference on Actual Problems of Electronic Instrument Engineering, IEEE Computer Society, pp. 451-453, 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE), Novosibirsk, 03/10/2016. https://doi.org/10.1109/APEIE.2016.7802200

APA

Letavin, D. A. (2016). Substrate permittivity impact to branch-line couplers miniaturization. In 2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1 (Vol. 1, pp. 451-453). [7802200] (International Conference on Actual Problems of Electronic Instrument Engineering). IEEE Computer Society. https://doi.org/10.1109/APEIE.2016.7802200

Vancouver

Letavin DA. Substrate permittivity impact to branch-line couplers miniaturization. In 2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1. Vol. 1. IEEE Computer Society. 2016. p. 451-453. 7802200. (International Conference on Actual Problems of Electronic Instrument Engineering). doi: 10.1109/APEIE.2016.7802200

Author

Letavin, Denis A. / Substrate permittivity impact to branch-line couplers miniaturization. 2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1. Vol. 1 IEEE Computer Society, 2016. pp. 451-453 (International Conference on Actual Problems of Electronic Instrument Engineering).

BibTeX

@inproceedings{c5769b099f0844f8855d69e91f427eed,
title = "Substrate permittivity impact to branch-line couplers miniaturization",
keywords = "miniaturization, microstrip line, lowpass filter, branch-line coupler, COMPACT-SIZE, RAT-RACE",
author = "Letavin, {Denis A.}",
year = "2016",
month = dec,
day = "29",
doi = "10.1109/APEIE.2016.7802200",
language = "English",
volume = "1",
series = "International Conference on Actual Problems of Electronic Instrument Engineering",
publisher = "IEEE Computer Society",
pages = "451--453",
booktitle = "2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1",
address = "United States",
note = "13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE) ; Conference date: 03-10-2016 Through 06-10-2016",

}

RIS

TY - GEN

T1 - Substrate permittivity impact to branch-line couplers miniaturization

AU - Letavin, Denis A.

PY - 2016/12/29

Y1 - 2016/12/29

KW - miniaturization

KW - microstrip line

KW - lowpass filter

KW - branch-line coupler

KW - COMPACT-SIZE

KW - RAT-RACE

UR - http://www.scopus.com/inward/record.url?scp=85020720151&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000392622500116

U2 - 10.1109/APEIE.2016.7802200

DO - 10.1109/APEIE.2016.7802200

M3 - Conference contribution

VL - 1

T3 - International Conference on Actual Problems of Electronic Instrument Engineering

SP - 451

EP - 453

BT - 2016 13TH INTERNATIONAL SCIENTIFIC-TECHNICAL CONFERENCE ON ACTUAL PROBLEMS OF ELECTRONIC INSTRUMENT ENGINEERING (APEIE), VOL 1

PB - IEEE Computer Society

T2 - 13th International Scientific-Technical Conference on Actual Problems of Electronics Instrument Engineering (APEIE)

Y2 - 3 October 2016 through 6 October 2016

ER -

ID: 1617958