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Solid state amorphization in a thin Fe-Si-Mg-O surface film triggered by the reduction of elements from oxides in the temperature range of the α-γ transformation. / Lobanov, M. L.; Yurovskikh, A. S.; Reznik, P. L. et al.
In: Letters on Materials, Vol. 10, No. 1, 02.2020, p. 83-88.

Research output: Contribution to journal › Article › peer-review

Harvard

Lobanov, ML, Yurovskikh, AS, Reznik, PL, Nikul’chenkov, NN, Rusakov, GM & Redikul’tsev, AA 2020, 'Solid state amorphization in a thin Fe-Si-Mg-O surface film triggered by the reduction of elements from oxides in the temperature range of the α-γ transformation', Letters on Materials, vol. 10, no. 1, pp. 83-88. https://doi.org/10.22226/2410-3535-2020-1-83-88

APA

Lobanov, M. L., Yurovskikh, A. S., Reznik, P. L., Nikul’chenkov, N. N., Rusakov, G. M., & Redikul’tsev, A. A. (2020). Solid state amorphization in a thin Fe-Si-Mg-O surface film triggered by the reduction of elements from oxides in the temperature range of the α-γ transformation. Letters on Materials, 10(1), 83-88. https://doi.org/10.22226/2410-3535-2020-1-83-88

Vancouver

Lobanov ML, Yurovskikh AS, Reznik PL, Nikul’chenkov NN, Rusakov GM, Redikul’tsev AA. Solid state amorphization in a thin Fe-Si-Mg-O surface film triggered by the reduction of elements from oxides in the temperature range of the α-γ transformation. Letters on Materials. 2020 Feb;10(1):83-88. doi: 10.22226/2410-3535-2020-1-83-88

Author

Lobanov, M. L. ; Yurovskikh, A. S. ; Reznik, P. L. et al. / Solid state amorphization in a thin Fe-Si-Mg-O surface film triggered by the reduction of elements from oxides in the temperature range of the α-γ transformation. In: Letters on Materials. 2020 ; Vol. 10, No. 1. pp. 83-88.

BibTeX

@article{279737eff1bf40b6af90dd6a075214dc,
title = "Solid state amorphization in a thin Fe-Si-Mg-O surface film triggered by the reduction of elements from oxides in the temperature range of the α-γ transformation",
keywords = "Metallic glasses, Phase transitions, Solid-state amorphisation, X-ray diffraction, CRYSTALLIZATION, ELECTRICAL STEEL, solid-state amorphisation, SILICON, phase transitions, ALLOY, metallic glasses, LAYERS",
author = "Lobanov, {M. L.} and Yurovskikh, {A. S.} and Reznik, {P. L.} and Nikul{\textquoteright}chenkov, {N. N.} and Rusakov, {G. M.} and Redikul{\textquoteright}tsev, {A. A.}",
year = "2020",
month = feb,
doi = "10.22226/2410-3535-2020-1-83-88",
language = "English",
volume = "10",
pages = "83--88",
journal = "Letters on Materials",
issn = "2218-5046",
publisher = "Институт проблем сверхпластичности металлов Российской академии наук",
number = "1",

}

RIS

TY - JOUR

T1 - Solid state amorphization in a thin Fe-Si-Mg-O surface film triggered by the reduction of elements from oxides in the temperature range of the α-γ transformation

AU - Lobanov, M. L.

AU - Yurovskikh, A. S.

AU - Reznik, P. L.

AU - Nikul’chenkov, N. N.

AU - Rusakov, G. M.

AU - Redikul’tsev, A. A.

PY - 2020/2

Y1 - 2020/2

KW - Metallic glasses

KW - Phase transitions

KW - Solid-state amorphisation

KW - X-ray diffraction

KW - CRYSTALLIZATION

KW - ELECTRICAL STEEL

KW - solid-state amorphisation

KW - SILICON

KW - phase transitions

KW - ALLOY

KW - metallic glasses

KW - LAYERS

UR - http://www.scopus.com/inward/record.url?scp=85079877888&partnerID=8YFLogxK

UR - https://elibrary.ru/item.asp?id=42407843

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000514855400015

U2 - 10.22226/2410-3535-2020-1-83-88

DO - 10.22226/2410-3535-2020-1-83-88

M3 - Article

AN - SCOPUS:85079877888

VL - 10

SP - 83

EP - 88

JO - Letters on Materials

JF - Letters on Materials

SN - 2218-5046

IS - 1

ER -

ID: 12250533