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Photoluminescence of implantation-induced defects in SiO2:Pb+ glasses. / Zatsepin, A. F.; Buntov, E. A.; Kortov, V. S. et al.
In: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, Vol. 8, No. 3, 01.01.2014, p. 540-544.

Research output: Contribution to journal › Article › peer-review

Harvard

Zatsepin, AF, Buntov, EA, Kortov, VS, Pustovarov, VA & Gavrilov, NV 2014, 'Photoluminescence of implantation-induced defects in SiO2:Pb+ glasses', Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, vol. 8, no. 3, pp. 540-544. https://doi.org/10.1134/S1027451014030380

APA

Zatsepin, A. F., Buntov, E. A., Kortov, V. S., Pustovarov, V. A., & Gavrilov, N. V. (2014). Photoluminescence of implantation-induced defects in SiO2:Pb+ glasses. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques, 8(3), 540-544. https://doi.org/10.1134/S1027451014030380

Vancouver

Zatsepin AF, Buntov EA, Kortov VS, Pustovarov VA, Gavrilov NV. Photoluminescence of implantation-induced defects in SiO2:Pb+ glasses. Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 2014 Jan 1;8(3):540-544. doi: 10.1134/S1027451014030380

Author

Zatsepin, A. F. ; Buntov, E. A. ; Kortov, V. S. et al. / Photoluminescence of implantation-induced defects in SiO2:Pb+ glasses. In: Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques. 2014 ; Vol. 8, No. 3. pp. 540-544.

BibTeX

@article{9d71ad73306c4e75a4c63b5cc2ce66ae,
title = "Photoluminescence of implantation-induced defects in SiO2:Pb+ glasses",
author = "Zatsepin, {A. F.} and Buntov, {E. A.} and Kortov, {V. S.} and Pustovarov, {V. A.} and Gavrilov, {N. V.}",
year = "2014",
month = jan,
day = "1",
doi = "10.1134/S1027451014030380",
language = "English",
volume = "8",
pages = "540--544",
journal = "Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques",
issn = "1027-4510",
publisher = "Pleiades Publishing",
number = "3",

}

RIS

TY - JOUR

T1 - Photoluminescence of implantation-induced defects in SiO2:Pb+ glasses

AU - Zatsepin, A. F.

AU - Buntov, E. A.

AU - Kortov, V. S.

AU - Pustovarov, V. A.

AU - Gavrilov, N. V.

PY - 2014/1/1

Y1 - 2014/1/1

UR - http://www.scopus.com/inward/record.url?scp=84906859204&partnerID=8YFLogxK

UR - https://elibrary.ru/item.asp?id=23987408

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000213890700021

U2 - 10.1134/S1027451014030380

DO - 10.1134/S1027451014030380

M3 - Article

AN - SCOPUS:84906859204

VL - 8

SP - 540

EP - 544

JO - Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques

JF - Journal of Surface Investigation. X-ray, Synchrotron and Neutron Techniques

SN - 1027-4510

IS - 3

ER -

ID: 364851