Standard

Pb+ implanted SiO2 probed by soft x-ray emission and absorption spectroscopy. / Zatsepin, D. A.; Hunt, A.; Moewes, A. et al.
In: Journal of Non-Crystalline Solids, Vol. 357, No. 18, 15.09.2011, p. 3381-3384.

Research output: Contribution to journal › Article › peer-review

Harvard

Zatsepin, DA, Hunt, A, Moewes, A, Kurmaev, EZ, Gavrilov, NV, Zhidkov, IS & Cholakh, SO 2011, 'Pb+ implanted SiO2 probed by soft x-ray emission and absorption spectroscopy', Journal of Non-Crystalline Solids, vol. 357, no. 18, pp. 3381-3384. https://doi.org/10.1016/j.jnoncrysol.2011.06.005

APA

Zatsepin, D. A., Hunt, A., Moewes, A., Kurmaev, E. Z., Gavrilov, N. V., Zhidkov, I. S., & Cholakh, S. O. (2011). Pb+ implanted SiO2 probed by soft x-ray emission and absorption spectroscopy. Journal of Non-Crystalline Solids, 357(18), 3381-3384. https://doi.org/10.1016/j.jnoncrysol.2011.06.005

Vancouver

Zatsepin DA, Hunt A, Moewes A, Kurmaev EZ, Gavrilov NV, Zhidkov IS et al. Pb+ implanted SiO2 probed by soft x-ray emission and absorption spectroscopy. Journal of Non-Crystalline Solids. 2011 Sept 15;357(18):3381-3384. doi: 10.1016/j.jnoncrysol.2011.06.005

Author

Zatsepin, D. A. ; Hunt, A. ; Moewes, A. et al. / Pb+ implanted SiO2 probed by soft x-ray emission and absorption spectroscopy. In: Journal of Non-Crystalline Solids. 2011 ; Vol. 357, No. 18. pp. 3381-3384.

BibTeX

@article{8ffa9b9e580d4d769b3881c6d2f0fdd5,
title = "Pb+ implanted SiO2 probed by soft x-ray emission and absorption spectroscopy",
keywords = "Amorphization, Glassy and crystalline silica, Ion implantation, Lead silicate glasses, Soft x-ray emission and absorption spectroscopy",
author = "Zatsepin, {D. A.} and A. Hunt and A. Moewes and Kurmaev, {E. Z.} and Gavrilov, {N. V.} and Zhidkov, {I. S.} and Cholakh, {S. O.}",
year = "2011",
month = sep,
day = "15",
doi = "10.1016/j.jnoncrysol.2011.06.005",
language = "English",
volume = "357",
pages = "3381--3384",
journal = "Journal of Non-Crystalline Solids",
issn = "0022-3093",
publisher = "Elsevier BV",
number = "18",

}

RIS

TY - JOUR

T1 - Pb+ implanted SiO2 probed by soft x-ray emission and absorption spectroscopy

AU - Zatsepin, D. A.

AU - Hunt, A.

AU - Moewes, A.

AU - Kurmaev, E. Z.

AU - Gavrilov, N. V.

AU - Zhidkov, I. S.

AU - Cholakh, S. O.

PY - 2011/9/15

Y1 - 2011/9/15

KW - Amorphization

KW - Glassy and crystalline silica

KW - Ion implantation

KW - Lead silicate glasses

KW - Soft x-ray emission and absorption spectroscopy

UR - http://www.scopus.com/inward/record.url?scp=79960924352&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000294593000015

U2 - 10.1016/j.jnoncrysol.2011.06.005

DO - 10.1016/j.jnoncrysol.2011.06.005

M3 - Article

AN - SCOPUS:79960924352

VL - 357

SP - 3381

EP - 3384

JO - Journal of Non-Crystalline Solids

JF - Journal of Non-Crystalline Solids

SN - 0022-3093

IS - 18

ER -

ID: 8235180