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New approach to the analysis of negative magnetostriction in two-dimensional structures
Research output
:
Contribution to journal
›
Article
›
peer-review
Section of Optoelectronics and Semiconductor Technology
Academic Laboratory of Scanning Probe Microscopy
Department of Condensed Matter Physics and Nanoscale Systems
Institute of Natural Sciences and Mathematics
Overview
Cite this
DOI
https://doi.org/10.1134/1.1187920
Final published version
G. M. Min'kov
S. A. Negashev
O. É Rut
A. V. Germanenko
O. I. Khrykin
V. I. Shashkin
V. M. Daniltsev
Original language
English
Pages (from-to)
898-900
Number of pages
3
Journal
Semiconductors
Volume
33
Issue number
8
DOIs
https://doi.org/10.1134/1.1187920
Publication status
Published -
1 Jan 1999
ASJC Scopus subject areas
Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
WoS ResearchAreas Categories
Physics, Condensed Matter
ID: 8637732