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Miniature branch-line coupler structure analysis. /
Letavin, Denis A. 2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2017 - Proceedings. IEEE Computer Society, 2017. p. 99-101 7981717.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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Letavin, DA 2017,
Miniature branch-line coupler structure analysis. in
2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2017 - Proceedings., 7981717, IEEE Computer Society, pp. 99-101, 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2017, Erlagol, Altai, Russian Federation,
29/06/2017.
https://doi.org/10.1109/EDM.2017.7981717
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BibTeX
@inproceedings{597c4341399748a28436ba3c10ad779a,
title = "Miniature branch-line coupler structure analysis",
keywords = "Accuracy, Breakdown, Low-pass filter, Miniaturization",
author = "Letavin, {Denis A.}",
year = "2017",
month = jul,
day = "14",
doi = "10.1109/EDM.2017.7981717",
language = "English",
pages = "99--101",
booktitle = "2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2017 - Proceedings",
publisher = "IEEE Computer Society",
address = "United States",
note = "18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2017 ; Conference date: 29-06-2017 Through 03-07-2017",
}
RIS
TY - GEN
T1 - Miniature branch-line coupler structure analysis
AU - Letavin, Denis A.
PY - 2017/7/14
Y1 - 2017/7/14
KW - Accuracy
KW - Breakdown
KW - Low-pass filter
KW - Miniaturization
UR - http://www.scopus.com/inward/record.url?scp=85027132868&partnerID=8YFLogxK
UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000412127000023
U2 - 10.1109/EDM.2017.7981717
DO - 10.1109/EDM.2017.7981717
M3 - Conference contribution
AN - SCOPUS:85027132868
SP - 99
EP - 101
BT - 2017 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2017 - Proceedings
PB - IEEE Computer Society
T2 - 18th International Conference of Young Specialists on Micro/Nanotechnologies and Electron Devices, EDM 2017
Y2 - 29 June 2017 through 3 July 2017
ER -
