Standard

Low Energy Electron Emission from Surface-Interface States of SiO2:Ge Films. / Zatsepin, A. F.; Buntov, E. A.; Mikhailovich, A. P. et al.
FUNDAMENTALS AND APPLICATIONS IN SILICA AND ADVANCED DIELECTRICS (SIO2014). ed. / CM Carbonaro; PC Ricci. American Institute of Physics Publising LLC, 2014. p. 179-184 (AIP Conference Proceedings; Vol. 1624).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Harvard

Zatsepin, AF, Buntov, EA, Mikhailovich, AP, Slesarev, AI, Fitting, H-J & Schmidt, B 2014, Low Energy Electron Emission from Surface-Interface States of SiO2:Ge Films. in CM Carbonaro & PC Ricci (eds), FUNDAMENTALS AND APPLICATIONS IN SILICA AND ADVANCED DIELECTRICS (SIO2014). AIP Conference Proceedings, vol. 1624, American Institute of Physics Publising LLC, pp. 179-184, 10th International Symposium on SiO2, Advanced Dielectrics and Related Devices, Italy, 16/06/2014. https://doi.org/10.1063/1.4900475

APA

Zatsepin, A. F., Buntov, E. A., Mikhailovich, A. P., Slesarev, A. I., Fitting, H. -J., & Schmidt, B. (2014). Low Energy Electron Emission from Surface-Interface States of SiO2:Ge Films. In CM. Carbonaro, & PC. Ricci (Eds.), FUNDAMENTALS AND APPLICATIONS IN SILICA AND ADVANCED DIELECTRICS (SIO2014) (pp. 179-184). (AIP Conference Proceedings; Vol. 1624). American Institute of Physics Publising LLC. https://doi.org/10.1063/1.4900475

Vancouver

Zatsepin AF, Buntov EA, Mikhailovich AP, Slesarev AI, Fitting H-J, Schmidt B. Low Energy Electron Emission from Surface-Interface States of SiO2:Ge Films. In Carbonaro CM, Ricci PC, editors, FUNDAMENTALS AND APPLICATIONS IN SILICA AND ADVANCED DIELECTRICS (SIO2014). American Institute of Physics Publising LLC. 2014. p. 179-184. (AIP Conference Proceedings). doi: 10.1063/1.4900475

Author

Zatsepin, A. F. ; Buntov, E. A. ; Mikhailovich, A. P. et al. / Low Energy Electron Emission from Surface-Interface States of SiO2:Ge Films. FUNDAMENTALS AND APPLICATIONS IN SILICA AND ADVANCED DIELECTRICS (SIO2014). editor / CM Carbonaro ; PC Ricci. American Institute of Physics Publising LLC, 2014. pp. 179-184 (AIP Conference Proceedings).

BibTeX

@inproceedings{729b5a769eb245b5946b5367fddff0dd,
title = "Low Energy Electron Emission from Surface-Interface States of SiO2:Ge Films",
keywords = "SILICON",
author = "Zatsepin, {A. F.} and Buntov, {E. A.} and Mikhailovich, {A. P.} and Slesarev, {A. I.} and Fitting, {H. -J.} and B. Schmidt",
year = "2014",
doi = "10.1063/1.4900475",
language = "English",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Publising LLC",
pages = "179--184",
editor = "CM Carbonaro and PC Ricci",
booktitle = "FUNDAMENTALS AND APPLICATIONS IN SILICA AND ADVANCED DIELECTRICS (SIO2014)",
address = "United States",
note = "10th International Symposium on SiO2, Advanced Dielectrics and Related Devices ; Conference date: 16-06-2014 Through 18-06-2014",

}

RIS

TY - GEN

T1 - Low Energy Electron Emission from Surface-Interface States of SiO2:Ge Films

AU - Zatsepin, A. F.

AU - Buntov, E. A.

AU - Mikhailovich, A. P.

AU - Slesarev, A. I.

AU - Fitting, H. -J.

AU - Schmidt, B.

PY - 2014

Y1 - 2014

KW - SILICON

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000345974700027

U2 - 10.1063/1.4900475

DO - 10.1063/1.4900475

M3 - Conference contribution

T3 - AIP Conference Proceedings

SP - 179

EP - 184

BT - FUNDAMENTALS AND APPLICATIONS IN SILICA AND ADVANCED DIELECTRICS (SIO2014)

A2 - Carbonaro, CM

A2 - Ricci, PC

PB - American Institute of Physics Publising LLC

T2 - 10th International Symposium on SiO2, Advanced Dielectrics and Related Devices

Y2 - 16 June 2014 through 18 June 2014

ER -

ID: 534698