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Effect of the fraction of semiconducting inclusions on the properties of self-sustained oscillations in a metal-semiconductor system. / Melkikh, A. V.; Povzner, A. A.; Cherepanova, A. N.
In: Technical Physics, Vol. 54, No. 11, 11.2009, p. 1705-1707.

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@article{8a098c4d2c6c432f823e8fd60732e6e6,
title = "Effect of the fraction of semiconducting inclusions on the properties of self-sustained oscillations in a metal-semiconductor system",
author = "Melkikh, {A. V.} and Povzner, {A. A.} and Cherepanova, {A. N.}",
year = "2009",
month = nov,
doi = "10.1134/S1063784209110255",
language = "English",
volume = "54",
pages = "1705--1707",
journal = "Technical Physics",
issn = "1063-7842",
publisher = "American Institute of Physics Publising LLC",
number = "11",

}

RIS

TY - JOUR

T1 - Effect of the fraction of semiconducting inclusions on the properties of self-sustained oscillations in a metal-semiconductor system

AU - Melkikh, A. V.

AU - Povzner, A. A.

AU - Cherepanova, A. N.

PY - 2009/11

Y1 - 2009/11

UR - http://www.scopus.com/inward/record.url?scp=74249119698&partnerID=8YFLogxK

UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000272802900025

U2 - 10.1134/S1063784209110255

DO - 10.1134/S1063784209110255

M3 - Article

AN - SCOPUS:74249119698

VL - 54

SP - 1705

EP - 1707

JO - Technical Physics

JF - Technical Physics

SN - 1063-7842

IS - 11

ER -

ID: 30125081