Standard

Development of a Microcontact Model of Electric Contact Based on the Use of the Finite Element Method. / Sachkov, Igor N.; Turygina, Victoria F.; Ford, Vitaly et al.
International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2020. ed. / T.E. Simos; T.E. Simos; T.E. Simos; T.E. Simos; Ch. Tsitouras. American Institute of Physics Inc., 2022. 110033 (AIP Conference Proceedings; Vol. 2425).

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Harvard

Sachkov, IN, Turygina, VF, Ford, V & Matkovskaya, A 2022, Development of a Microcontact Model of Electric Contact Based on the Use of the Finite Element Method. in TE Simos, TE Simos, TE Simos, TE Simos & C Tsitouras (eds), International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2020., 110033, AIP Conference Proceedings, vol. 2425, American Institute of Physics Inc., International Conference on Numerical Analysis and Applied Mathematics 2020, ICNAAM 2020, Rhodes, Greece, 17/09/2020. https://doi.org/10.1063/5.0081427

APA

Sachkov, I. N., Turygina, V. F., Ford, V., & Matkovskaya, A. (2022). Development of a Microcontact Model of Electric Contact Based on the Use of the Finite Element Method. In T. E. Simos, T. E. Simos, T. E. Simos, T. E. Simos, & C. Tsitouras (Eds.), International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2020 [110033] (AIP Conference Proceedings; Vol. 2425). American Institute of Physics Inc.. https://doi.org/10.1063/5.0081427

Vancouver

Sachkov IN, Turygina VF, Ford V, Matkovskaya A. Development of a Microcontact Model of Electric Contact Based on the Use of the Finite Element Method. In Simos TE, Simos TE, Simos TE, Simos TE, Tsitouras C, editors, International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2020. American Institute of Physics Inc. 2022. 110033. (AIP Conference Proceedings). doi: 10.1063/5.0081427

Author

Sachkov, Igor N. ; Turygina, Victoria F. ; Ford, Vitaly et al. / Development of a Microcontact Model of Electric Contact Based on the Use of the Finite Element Method. International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2020. editor / T.E. Simos ; T.E. Simos ; T.E. Simos ; T.E. Simos ; Ch. Tsitouras. American Institute of Physics Inc., 2022. (AIP Conference Proceedings).

BibTeX

@inproceedings{af18d5a85b6b414d884f161f9ea2ea09,
title = "Development of a Microcontact Model of Electric Contact Based on the Use of the Finite Element Method",
keywords = "computer model, conductive heat transfer, contact pair, electric current, finite element, microcontact model, microcontacts, temperature distribution",
author = "Sachkov, {Igor N.} and Turygina, {Victoria F.} and Vitaly Ford and Alena Matkovskaya",
note = "Publisher Copyright: {\textcopyright} 2022 American Institute of Physics Inc.. All rights reserved.; International Conference on Numerical Analysis and Applied Mathematics 2020, ICNAAM 2020 ; Conference date: 17-09-2020 Through 23-09-2020",
year = "2022",
month = apr,
day = "6",
doi = "10.1063/5.0081427",
language = "English",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
editor = "T.E. Simos and T.E. Simos and T.E. Simos and T.E. Simos and Ch. Tsitouras",
booktitle = "International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2020",
address = "United States",

}

RIS

TY - GEN

T1 - Development of a Microcontact Model of Electric Contact Based on the Use of the Finite Element Method

AU - Sachkov, Igor N.

AU - Turygina, Victoria F.

AU - Ford, Vitaly

AU - Matkovskaya, Alena

N1 - Publisher Copyright: © 2022 American Institute of Physics Inc.. All rights reserved.

PY - 2022/4/6

Y1 - 2022/4/6

KW - computer model

KW - conductive heat transfer

KW - contact pair

KW - electric current

KW - finite element

KW - microcontact model

KW - microcontacts

KW - temperature distribution

UR - http://www.scopus.com/inward/record.url?scp=85128509398&partnerID=8YFLogxK

U2 - 10.1063/5.0081427

DO - 10.1063/5.0081427

M3 - Conference contribution

AN - SCOPUS:85128509398

T3 - AIP Conference Proceedings

BT - International Conference on Numerical Analysis and Applied Mathematics, ICNAAM 2020

A2 - Simos, T.E.

A2 - Simos, T.E.

A2 - Simos, T.E.

A2 - Simos, T.E.

A2 - Tsitouras, Ch.

PB - American Institute of Physics Inc.

T2 - International Conference on Numerical Analysis and Applied Mathematics 2020, ICNAAM 2020

Y2 - 17 September 2020 through 23 September 2020

ER -

ID: 30106763