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Characterization of 1T-TiSe2 surface by means of STM and XPD experiments and model calculations
Research output
:
Contribution to journal
›
Article
›
peer-review
Institute of Natural Sciences and Mathematics
Institute of Mechanics and Machine Building
Institute of Material Science and Metallurgy
Department of Experimental Physics
Department of Electronic Engineering
Department of Glass Technology
Department of Condensed Matter Physics
Institute of Physics and Technology
Institute of New Materials and Technologies
Overview
Cite this
DOI
https://doi.org/10.1016/j.susc.2012.06.008
Final published version
M. V. Kuznetsov
I. I. Ogorodnikov
A. S. Vorokh
A. S. Rasinkin
A. N. Titov
Original language
English
Pages (from-to)
1760-1770
Number of pages
11
Journal
Surface Science
Volume
606
Issue number
23-24
DOIs
https://doi.org/10.1016/j.susc.2012.06.008
Publication status
Published -
Dec 2012
Research areas
Surface structure, Titanium diselenide, Scanning tunneling microscopy, Photoelectron holography, X-ray photoelectron diffraction, Surface relaxation, RAY PHOTOELECTRON DIFFRACTION, TRANSITION-METAL DICHALCOGENIDES, SCANNING-TUNNELING-MICROSCOPY, ELECTRONIC-STRUCTURE, MULTIPLE-SCATTERING, ATOMIC-STRUCTURE, TIS2, HOLOGRAPHY, IMAGES
WoS ResearchAreas Categories
Chemistry, Physical
Physics, Condensed Matter
ASJC Scopus subject areas
Surfaces and Interfaces
Condensed Matter Physics
Materials Chemistry
Surfaces, Coatings and Films
ID: 1069512
