DOI

Original languageEnglish
Title of host publicationProceedings of 2017 20th IEEE International Conference on Soft Computing and Measurements, SCM 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages199-202
Number of pages4
ISBN (Electronic)9781538618103
DOIs
Publication statusPublished - 6 Jul 2017
Event20th IEEE International Conference on Soft Computing and Measurements, SCM 2017 - St. Petersburg, Russian Federation
Duration: 24 May 2017 → 26 May 2017

Conference

Conference20th IEEE International Conference on Soft Computing and Measurements, SCM 2017
Country/TerritoryRussian Federation
CitySt. Petersburg
Period24/05/2017 → 26/05/2017

    ASJC Scopus subject areas

  • Management Science and Operations Research
  • Control and Optimization
  • Artificial Intelligence
  • Computational Theory and Mathematics
  • Computer Networks and Communications
  • Computer Science Applications
  • Statistics, Probability and Uncertainty
  • Modelling and Simulation

    Research areas

  • instantaneous asymmetry, losses of electrical power, non-linear parameters, non-sinusoidal, skin effect

    WoS ResearchAreas Categories

  • Computer Science, Theory & Methods
  • Engineering, Electrical & Electronic

ID: 2043124