Standard
Harvard
Nikul'chenkov, NN, Loginov, AB
, Danilov, SV & Loginov, BA 2020,
Analysis of the structure of thin amorphizing layers of the Fe-Si-Cu-Mg-O system. in E Gorkunov, VE Panin & H Irschik (eds),
Mechanics, Resource and Diagnostics of Materials and Structures, MRDMS 2020: Proceeding of the 14th International Conference on Mechanics, Resource and Diagnostics of Materials and Structures., 030012, AIP Conference Proceedings, vol. 2315, American Institute of Physics Inc., 14th International Conference on Mechanics, Resource and Diagnostics of Materials and Structures, MRDMS 2020, Ekaterinburg, Russian Federation,
09/11/2020.
https://doi.org/10.1063/5.0037044
APA
Nikul'chenkov, N. N., Loginov, A. B.
, Danilov, S. V., & Loginov, B. A. (2020).
Analysis of the structure of thin amorphizing layers of the Fe-Si-Cu-Mg-O system. In E. Gorkunov, V. E. Panin, & H. Irschik (Eds.),
Mechanics, Resource and Diagnostics of Materials and Structures, MRDMS 2020: Proceeding of the 14th International Conference on Mechanics, Resource and Diagnostics of Materials and Structures [030012] (AIP Conference Proceedings; Vol. 2315). American Institute of Physics Inc..
https://doi.org/10.1063/5.0037044
Vancouver
Nikul'chenkov NN, Loginov AB
, Danilov SV, Loginov BA.
Analysis of the structure of thin amorphizing layers of the Fe-Si-Cu-Mg-O system. In Gorkunov E, Panin VE, Irschik H, editors, Mechanics, Resource and Diagnostics of Materials and Structures, MRDMS 2020: Proceeding of the 14th International Conference on Mechanics, Resource and Diagnostics of Materials and Structures. American Institute of Physics Inc. 2020. 030012. (AIP Conference Proceedings). doi: 10.1063/5.0037044
Author
BibTeX
@inproceedings{217b187ee5e6484694104d7dd29a3998,
title = "Analysis of the structure of thin amorphizing layers of the Fe-Si-Cu-Mg-O system",
author = "Nikul'chenkov, {N. N.} and Loginov, {A. B.} and Danilov, {S. V.} and Loginov, {B. A.}",
year = "2020",
month = dec,
day = "17",
doi = "10.1063/5.0037044",
language = "English",
series = "AIP Conference Proceedings",
publisher = "American Institute of Physics Inc.",
editor = "Eduard Gorkunov and Panin, {Victor E.} and Hans Irschik",
booktitle = "Mechanics, Resource and Diagnostics of Materials and Structures, MRDMS 2020",
address = "United States",
note = "14th International Conference on Mechanics, Resource and Diagnostics of Materials and Structures, MRDMS 2020 ; Conference date: 09-11-2020 Through 13-11-2020",
}
RIS
TY - GEN
T1 - Analysis of the structure of thin amorphizing layers of the Fe-Si-Cu-Mg-O system
AU - Nikul'chenkov, N. N.
AU - Loginov, A. B.
AU - Danilov, S. V.
AU - Loginov, B. A.
PY - 2020/12/17
Y1 - 2020/12/17
UR - http://www.scopus.com/inward/record.url?scp=85098635454&partnerID=8YFLogxK
UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000667945100120
U2 - 10.1063/5.0037044
DO - 10.1063/5.0037044
M3 - Conference contribution
AN - SCOPUS:85098635454
T3 - AIP Conference Proceedings
BT - Mechanics, Resource and Diagnostics of Materials and Structures, MRDMS 2020
A2 - Gorkunov, Eduard
A2 - Panin, Victor E.
A2 - Irschik, Hans
PB - American Institute of Physics Inc.
T2 - 14th International Conference on Mechanics, Resource and Diagnostics of Materials and Structures, MRDMS 2020
Y2 - 9 November 2020 through 13 November 2020
ER -
