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Aref, M & Oboskalov, V 2020,
A proposed approach to fault current calculation for microgrid considering the uncertainties of fault and distribution generations locations. in
Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020., 9111879, Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020, Institute of Electrical and Electronics Engineers Inc., 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020, Sochi, Russian Federation,
18/05/2020.
https://doi.org/10.1109/ICIEAM48468.2020.9111879
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@inproceedings{2fd7a482cd8d47e7ac067dd434392b25,
title = "A proposed approach to fault current calculation for microgrid considering the uncertainties of fault and distribution generations locations",
keywords = "DG, Fault, Inverter, Miucrogrid",
author = "Mahmoud Aref and Vladislav Oboskalov",
year = "2020",
month = may,
doi = "10.1109/ICIEAM48468.2020.9111879",
language = "English",
series = "Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020",
address = "United States",
note = "2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020 ; Conference date: 18-05-2020 Through 22-05-2020",
}
RIS
TY - GEN
T1 - A proposed approach to fault current calculation for microgrid considering the uncertainties of fault and distribution generations locations
AU - Aref, Mahmoud
AU - Oboskalov, Vladislav
PY - 2020/5
Y1 - 2020/5
KW - DG
KW - Fault
KW - Inverter
KW - Miucrogrid
UR - http://www.scopus.com/inward/record.url?scp=85086761136&partnerID=8YFLogxK
UR - https://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=tsmetrics&SrcApp=tsm_test&DestApp=WOS_CPL&DestLinkType=FullRecord&KeyUT=000607234900011
U2 - 10.1109/ICIEAM48468.2020.9111879
DO - 10.1109/ICIEAM48468.2020.9111879
M3 - Conference contribution
AN - SCOPUS:85086761136
T3 - Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020
BT - Proceedings - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2020 International Conference on Industrial Engineering, Applications and Manufacturing, ICIEAM 2020
Y2 - 18 May 2020 through 22 May 2020
ER -
