Although X-ray fluorescence spectrometry (XRF) is well-established and widely used technique for elemental analysis, XRF devices with total external reflection (TXRF) only recently became available for research and industrial laboratories. As the number of TXRF devices in use rises, the problems related to certification, calibration and standardization become more important. In this contribution we describe major steps of sample preparation, interpretation of the results obtained and graduation of the device. The study was performed on standard multielement solutions using TXRF spectrometer Nanohunter, manufactured by Rigaku Corp.