FIELD: nanotechnologies. SUBSTANCE: invention can be used for investigation of nanothin spatial dissipative structures. Essence of the invention lies in the fact that the method involves forming nanothin SDS in nanothin amorphous films at their one-sided heating, investigation of nanothin SDS by electron microscopic and microdiffraction methods with obtaining of their electron-microscopic images and micro-electron-diffraction patterns, determining by using the method of light and dark field indices of planes, causing appearance of corresponding bending contours on electron-microscopic images of nanothin SDS, and determination by means of the flexural contours method of bending and orientation parameters of nanothin SDS, as well as angles of rotation of the lattice of nanothin SDS and directions of rotational curvature of the array, constructing a two-dimensional geometric object - a surface of curvature of a lattice of nano-thin SDS for the selected crystallographic direction, differs by the fact that the constructed surface of the nano-thin SDS lattice curvature is taken as the neutral surface of the nanothin SDS by comparative analysis of neutral surface of nanothin SDS and neutral surfaces of thin plates, corresponding to geometric shape, serving as standards, detecting areas of maximum stress occurring in nanothin SDS, and using this information on features of bending of neutral surface of nanothin SDS for investigation and prediction of physical properties and physical processes in nanothin spatial dissipative structures, including formation and development of inter-unit boundaries in nano-thin polygons. EFFECT: enabling investigation of nucleation and development of inter-unit torsion boundaries in nanothin spatial dissipative structures with elastic rotational curvature of the lattice.